Capacitance transient spectroscopy in metal-insulator-metal systems and its application to the determination of trap parameters in polyimide films

1999 ◽  
Vol 85 (2) ◽  
pp. 1089-1094 ◽  
Author(s):  
D. Liufu ◽  
K. C. Kao
Keyword(s):  
Polyimide Films ◽  
Metal Insulator ◽  
Metal Insulator Metal ◽  
Transient Spectroscopy ◽  
Capacitance Transient

scholarly journals Assessment of dielectric charging in micro-electro-mechanical system capacitive switches

2013 ◽  
Vol 26 (3) ◽  
pp. 239-245
Author(s):  
M. Koutsoureli ◽  
L. Michalas ◽  
G. Papaioannou
Keyword(s):  
Mechanical System ◽  
Material Properties ◽  
Micro Electro Mechanical System ◽  
Capacitive Switches ◽  
Metal Insulator ◽  
Dielectric Charging ◽  
Metal Insulator Metal ◽  
Simultaneous Assessment

The assessment of dielectric charging in MEMS capacitive switches is investigated. The information can be obtained only from simultaneous assessment of Metal-Insulator-Metal capacitance and MEMS capacitive switches the former allowing the determination of material properties and the latter of the device.

Determination of the Density of State Distribution of a-Si:H by Isothermal Capacitance Transient Spectroscopy

1981 ◽  
Vol 20 (7) ◽  
pp. L549-L552 ◽  
Author(s):  
Hideyo Okushi ◽  
Yozo Tokumaru ◽  
Satoshi Yamasaki ◽  
Hidetoshi Oheda ◽  
Kazunobu Tanaka
Keyword(s):  
Density Of State ◽  
State Distribution ◽  
Transient Spectroscopy ◽  
Capacitance Transient ◽  
Isothermal Capacitance Transient Spectroscopy

Determination of the concentration of recombination centers in thin asymmetrical p-n junctions from capacitance transient spectroscopy

2006 ◽  
Vol 89 (11) ◽  
pp. 112107 ◽  
Author(s):  
Juan A. Jiménez Tejada ◽  
Pablo Lara Bullejos ◽  
Juan A. López Villanueva ◽  
Francisco M. Gómez-Campos ◽  
Salvador Rodríguez-Bolívar ◽  
...  
Keyword(s):  
Recombination Centers ◽  
Transient Spectroscopy ◽  
Capacitance Transient

Electrical and Optical Properties of Defects by Complementary Spectroscopies

1995 ◽  
Vol 411 ◽  
Author(s):  
A. Castaldini ◽  
A. Cavallini ◽  
P. Fernandez ◽  
B. Fraboni ◽  
J. Piqueras ◽  
...  
Keyword(s):  
Optical Properties ◽  
Comparative Analysis ◽  
Electrical Properties ◽  
Optical Spectroscopy ◽  
Minority Carrier ◽  
Electrical And Optical Properties ◽  
Carrier Trap ◽  
Transient Spectroscopy ◽  
Capacitance Transient

ABSTRACTDeep levels in II-VI compounds were investigated by complementary junction and optical spectroscopy methods to assess the characteristics of the traps as well as the limits and the reliability of the techniques applied. The electrical properties have been investigated by current and capacitance transient spectroscopy, while the optical properties have been studied by cathodoluminescence. A critical and comparative analysis of the results obtained with the various methods allowed the determination of the parameters and the nature (majority or minority carrier trap) of most of the detected levels.

Sign in / Sign up

Export Citation Format

Share Document