Negative-bias-temperature-instability and hot carrier effects in nanowire junctionless p-channel multigate transistors

Jong Tae Park; Jin Young Kim; Jean Pierre Colinge

doi:10.1063/1.3688245

Negative-bias-temperature-instability and hot carrier effects in nanowire junctionless p-channel multigate transistors

Applied Physics Letters ◽

10.1063/1.3688245 ◽

2012 ◽

Vol 100 (8) ◽

pp. 083504 ◽

Cited By ~ 11

Author(s):

Jong Tae Park ◽

Jin Young Kim ◽

Jean Pierre Colinge

Keyword(s):

Negative Bias ◽

Negative Bias Temperature Instability ◽

Temperature Instability ◽

Hot Carrier ◽

Bias Temperature Instability ◽

Hot Carrier Effects

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Impact of Mixed Negative Bias Temperature Instability and Hot Carrier Stress on MOSFET Characteristics—Part I: Experimental

IEEE Transactions on Electron Devices ◽

10.1109/ted.2018.2873419 ◽

2019 ◽

Vol 66 (1) ◽

pp. 232-240 ◽

Cited By ~ 9

Author(s):

Bianka Ullmann ◽

Markus Jech ◽

Katja Puschkarsky ◽

Gunnar Andreas Rott ◽

Michael Waltl ◽

...

Keyword(s):

Negative Bias ◽

Negative Bias Temperature Instability ◽

Temperature Instability ◽

Hot Carrier ◽

Bias Temperature Instability ◽

Hot Carrier Stress

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Hot Carrier and Negative-Bias Temperature Instability Reliabilities of Strained-Si MOSFETs

IEEE Transactions on Electron Devices ◽

10.1109/ted.2007.898668 ◽

2007 ◽

Vol 54 (7) ◽

pp. 1799-1803 ◽

Cited By ~ 8

Author(s):

Chuan-Hsi Liu ◽

Tung-Ming Pan

Keyword(s):

Negative Bias ◽

Negative Bias Temperature Instability ◽

Strained Si ◽

Temperature Instability ◽

Hot Carrier ◽

Bias Temperature Instability

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Effect of Hot-Carrier Stress on the Recoverable and Permanent Components of Negative-Bias Temperature Instability

10.7567/ssdm.2010.c-8-2 ◽

2010 ◽

Author(s):

T. J. J. Ho ◽

D. S. Ang ◽

C. M. Ng

Keyword(s):

Negative Bias ◽

Negative Bias Temperature Instability ◽

Temperature Instability ◽

Hot Carrier ◽

Bias Temperature Instability ◽

Hot Carrier Stress

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Modeling of degradation caused by channel hot carrier and negative bias temperature instability effects in p-MOSFETs

2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology ◽

10.1109/icsict.2012.6467619 ◽

2012 ◽

Cited By ~ 1

Author(s):

C. Ma ◽

H. J. Mattausch ◽

M. Miyake ◽

T. Iizuka ◽

K. Matsuzawa ◽

...

Keyword(s):

Negative Bias ◽

Negative Bias Temperature Instability ◽

Temperature Instability ◽

Hot Carrier ◽

Bias Temperature Instability

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Reliability Analysis for Deuterium Incorporated Gate Oxide Film through Negative-bias Temperature Instability and Hot-carrier Injection

Journal of the Korean Institute of Electrical and Electronic Material Engineers ◽

10.4313/jkem.2008.21.8.687 ◽

2008 ◽

Vol 21 (8) ◽

pp. 687-694

Author(s):

Jae-Sung Lee

Keyword(s):

Oxide Film ◽

Reliability Analysis ◽

Gate Oxide ◽

Negative Bias ◽

Carrier Injection ◽

Negative Bias Temperature Instability ◽

Temperature Instability ◽

Hot Carrier ◽

Bias Temperature Instability ◽

Hot Carrier Injection

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Some issues of hot-carrier degradation and negative bias temperature instability of advanced SOI CMOS transistors

Solid-State Electronics ◽

10.1016/j.sse.2007.01.004 ◽

2007 ◽

Vol 51 (2) ◽

pp. 268-277 ◽

Cited By ~ 11

Author(s):

D.P. Ioannou ◽

D.E. Ioannou

Keyword(s):

Negative Bias ◽

Negative Bias Temperature Instability ◽

Temperature Instability ◽

Hot Carrier ◽

Cmos Transistors ◽

Bias Temperature Instability ◽

Hot Carrier Degradation ◽

Soi Cmos

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Hot carrier injection and negative bias temperature instability induced NMOS and PMOS degradation on CMOS Ring Oscillator

2016 Annual Reliability and Maintainability Symposium (RAMS) ◽

10.1109/rams.2016.7448024 ◽

2016 ◽

Cited By ~ 1

Author(s):

Insaf Lahbib ◽

Mohamed Aziz Doukkali ◽

Patrick Martin ◽

Guy Imbert

Keyword(s):

Ring Oscillator ◽

Negative Bias ◽

Carrier Injection ◽

Negative Bias Temperature Instability ◽

Temperature Instability ◽

Hot Carrier ◽

Bias Temperature Instability ◽

Hot Carrier Injection

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The impact of mixed negative bias temperature instability and hot carrier stress on single oxide defects

2017 IEEE International Reliability Physics Symposium (IRPS) ◽

10.1109/irps.2017.7936424 ◽

2017 ◽

Cited By ~ 2

Author(s):

B. Ullmann ◽

M. Jech ◽

S. Tyaginov ◽

M. Waltl ◽

Y. Illarionov ◽

...

Keyword(s):

Negative Bias ◽

Negative Bias Temperature Instability ◽

Temperature Instability ◽

Hot Carrier ◽

Bias Temperature Instability ◽

Hot Carrier Stress ◽

Oxide Defects ◽

The Impact

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The study of compressive and tensile stress on MOSFET's I-V, C-V characteristics and it's impacts on hot carrier injection and negative bias temperature instability

2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual. ◽

10.1109/relphy.2003.1197831 ◽

2003 ◽

Cited By ~ 5

Author(s):

J.R. Shih ◽

J.J. Wang ◽

W. Ken ◽

Yeng Peng ◽

J.T. Yue

Keyword(s):

Tensile Stress ◽

Negative Bias ◽

Carrier Injection ◽

Negative Bias Temperature Instability ◽

Temperature Instability ◽

Hot Carrier ◽

Bias Temperature Instability ◽

Hot Carrier Injection

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Impact of Mixed Negative Bias Temperature Instability and Hot Carrier Stress on MOSFET Characteristics—Part II: Theory

IEEE Transactions on Electron Devices ◽

10.1109/ted.2018.2873421 ◽

2019 ◽

Vol 66 (1) ◽

pp. 241-248 ◽

Cited By ~ 4

Author(s):

Markus Jech ◽

Bianka Ullmann ◽

Gerhard Rzepa ◽

Stanislav Tyaginov ◽

Alexander Grill ◽

...

Keyword(s):

Negative Bias ◽

Negative Bias Temperature Instability ◽

Temperature Instability ◽

Hot Carrier ◽

Bias Temperature Instability ◽

Hot Carrier Stress

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