Energetic distribution of interface states in GaN metal-semiconductor-metal photodetector structure obtained from low-frequency noise measurements

2011 ◽  
Author(s):  
Jungil Lee ◽  
S. K. Oh ◽  
Seonhee Kim ◽  
Jisoon Ihm ◽  
Hyeonsik Cheong
Keyword(s):  
Low Frequency ◽  
Interface States ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Metal Semiconductor Metal ◽  
Noise Measurements

scholarly journals LOW-FREQUENCY NOISE MEASUREMENTS OF IR PHOTODETECTORS WITH VOLTAGE CROSS CORRELATION SYSTEM

Measurement ◽  
2021 ◽  
pp. 109867
Author(s):  
Krzysztof ACHTENBERG ◽  
Janusz MIKOŁAJCZYK ◽  
Carmine CIOFI ◽  
Graziella SCANDURRA ◽  
Krystian MICHALCZEWSKI ◽  
...  
Keyword(s):  
Cross Correlation ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Ir Photodetectors ◽  
Noise Measurements ◽  
Correlation System

Low-Frequency Noise Measurements as a Quality Indicator for Ohmic Contacts to n-GaN

2003 ◽  
Vol 433-436 ◽  
pp. 677-680 ◽  
Author(s):  
Nobuhisa Tanuma ◽  
Hirokazu Tanizaki ◽  
Saburo Yokokura ◽  
T. Matsui ◽  
Sumihisa Hashiguchi ◽  
...  
Keyword(s):  
Quality Indicator ◽  
Ohmic Contacts ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Noise Measurements
Sign in / Sign up

Export Citation Format

Share Document