Characterization of deep-levels in silicon nanowires by low-frequency noise spectroscopy

2011 ◽  
Vol 99 (11) ◽  
pp. 113107 ◽  
Author(s):  
Abhishek Motayed ◽  
Sergiy Krylyuk ◽  
Albert V. Davydov
Keyword(s):  
Silicon Nanowires ◽  
Low Frequency ◽  
Deep Levels ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Noise Spectroscopy

Detection of Deep-Levels in Doped Silicon Nanowires Using Low-Frequency Noise Spectroscopy

2013 ◽  
Vol 60 (12) ◽  
pp. 4206-4212 ◽  
Author(s):  
Deepak Sharma ◽  
Abhishek Motayed ◽  
Sergiy Krylyuk ◽  
Qiliang Li ◽  
Albert V. Davydov
Keyword(s):  
Silicon Nanowires ◽  
Low Frequency ◽  
Deep Levels ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Noise Spectroscopy ◽  
Doped Silicon

Low-Frequency Noise Spectroscopy Characterization of HgCdTe Infrared Detectors

2020 ◽  
Vol 67 (2) ◽  
pp. 547-551 ◽  
Author(s):  
Liqi Zhu ◽  
Jian Huang ◽  
Zongheng Xie ◽  
Zhuo Deng ◽  
Lu Chen ◽  
...  
Keyword(s):  
Infrared Detectors ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Noise Spectroscopy

Characterization of polymer:fullerene solar cells by low-frequency noise spectroscopy

2013 ◽  
Vol 102 (22) ◽  
pp. 223902 ◽  
Author(s):  
G. Landi ◽  
C. Barone ◽  
A. De Sio ◽  
S. Pagano ◽  
H. C. Neitzert
Keyword(s):  
Solar Cells ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Noise Spectroscopy

Study of 14.9 MeV Neutron Irradiation Effects on Ni/GaN Schottky Contacts Using Low‐Frequency Noise Spectroscopy

2019 ◽  
Vol 217 (7) ◽  
pp. 1900701
Author(s):  
Yuan Ren ◽  
Leidang Zhou ◽  
Kang Zhang ◽  
Liang Chen ◽  
Xiaoping Ouyang ◽  
...  
Keyword(s):  
Neutron Irradiation ◽  
Low Frequency ◽  
Schottky Contacts ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Irradiation Effects ◽  
Noise Spectroscopy

Using low-frequency noise characterization of AlGaN/GaN HEMT as a tool for technology assessment and failure prediction

2004 ◽  
Author(s):  
Jean-Guy Tartarin ◽  
Geoffroy Soubercaze-Pun ◽  
Abdelali Rennane ◽  
Laurent Bary ◽  
Robert Plana ◽  
...  
Keyword(s):  
Technology Assessment ◽  
Low Frequency ◽  
Failure Prediction ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Gan Hemt ◽  
Noise Characterization
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