Determination of the parameters of deep levels in semiconductors using nonstationary spectroscopy and low-frequency noise spectroscopy

1998 ◽  
Vol 41 (12) ◽  
pp. 1157-1161 ◽  
Author(s):  
T. A. Kholomina
2011 ◽  
Vol 99 (11) ◽  
pp. 113107 ◽  
Author(s):  
Abhishek Motayed ◽  
Sergiy Krylyuk ◽  
Albert V. Davydov

2013 ◽  
Vol 60 (12) ◽  
pp. 4206-4212 ◽  
Author(s):  
Deepak Sharma ◽  
Abhishek Motayed ◽  
Sergiy Krylyuk ◽  
Qiliang Li ◽  
Albert V. Davydov

2019 ◽  
Vol 217 (7) ◽  
pp. 1900701
Author(s):  
Yuan Ren ◽  
Leidang Zhou ◽  
Kang Zhang ◽  
Liang Chen ◽  
Xiaoping Ouyang ◽  
...  

2000 ◽  
Vol 37 (6) ◽  
pp. 966 ◽  
Author(s):  
Lee J. I. ◽  
Han I .K. ◽  
Heo D. C. ◽  
Brini J. ◽  
Chovet A. ◽  
...  

2020 ◽  
Vol 67 (2) ◽  
pp. 547-551 ◽  
Author(s):  
Liqi Zhu ◽  
Jian Huang ◽  
Zongheng Xie ◽  
Zhuo Deng ◽  
Lu Chen ◽  
...  

1999 ◽  
Vol 46 (5) ◽  
pp. 968-974 ◽  
Author(s):  
C.T. Angelis ◽  
C.A. Dimitriadis ◽  
J. Brini ◽  
G. Kamarinos ◽  
V.K. Gueorguiev ◽  
...  

2017 ◽  
Vol 38 (8) ◽  
pp. 1109-1112 ◽  
Author(s):  
Nandha Kumar Subramani ◽  
Julien Couvidat ◽  
Ahmad Al Hajjar ◽  
Jean-Christophe Nallatamby ◽  
Didier Floriot ◽  
...  

Sign in / Sign up

Export Citation Format

Share Document