Characterization of Andreev reflection barriers by low frequency noise spectroscopy in all-thin-film superconducting point contacts

1995 ◽  
Vol 5 (2) ◽  
pp. 3077-3080 ◽  
Author(s):  
K. Hamasaki ◽  
T. Ikuta ◽  
A. Tachibana ◽  
T. Fukumoto
Keyword(s):  
Thin Film ◽  
Andreev Reflection ◽  
Low Frequency ◽  
Frequency Noise ◽  
Point Contacts ◽  
Low Frequency Noise ◽  
Noise Spectroscopy

Low-Frequency Noise Spectroscopy Characterization of HgCdTe Infrared Detectors

2020 ◽  
Vol 67 (2) ◽  
pp. 547-551 ◽  
Author(s):  
Liqi Zhu ◽  
Jian Huang ◽  
Zongheng Xie ◽  
Zhuo Deng ◽  
Lu Chen ◽  
...  
Keyword(s):  
Infrared Detectors ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Noise Spectroscopy

Low frequency noise properties of all‐thin film superconducting point contacts

1994 ◽  
Vol 64 (17) ◽  
pp. 2309-2311 ◽  
Author(s):  
M. Hatle ◽  
K. Hamasaki ◽  
K. Kojima
Keyword(s):  
Thin Film ◽  
Low Frequency ◽  
Frequency Noise ◽  
Point Contacts ◽  
Low Frequency Noise

Low-frequency noise spectroscopy of polycrystalline silicon thin-film transistors

1999 ◽  
Vol 46 (5) ◽  
pp. 968-974 ◽  
Author(s):  
C.T. Angelis ◽  
C.A. Dimitriadis ◽  
J. Brini ◽  
G. Kamarinos ◽  
V.K. Gueorguiev ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Silicon Thin Film ◽  
Noise Spectroscopy

Characterization of deep-levels in silicon nanowires by low-frequency noise spectroscopy

2011 ◽  
Vol 99 (11) ◽  
pp. 113107 ◽  
Author(s):  
Abhishek Motayed ◽  
Sergiy Krylyuk ◽  
Albert V. Davydov
Keyword(s):  
Silicon Nanowires ◽  
Low Frequency ◽  
Deep Levels ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Noise Spectroscopy

Characterization of polymer:fullerene solar cells by low-frequency noise spectroscopy

2013 ◽  
Vol 102 (22) ◽  
pp. 223902 ◽  
Author(s):  
G. Landi ◽  
C. Barone ◽  
A. De Sio ◽  
S. Pagano ◽  
H. C. Neitzert
Keyword(s):  
Solar Cells ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Noise Spectroscopy

Characterization of High-Current Stress-Induced Instability in Amorphous InGaZnO Thin-Film Transistors by Low-Frequency Noise Measurements

2013 ◽  
Vol 34 (11) ◽  
pp. 1403-1405 ◽  
Author(s):  
Andreas Tsormpatzoglou ◽  
Nikolaos A. Hastas ◽  
Forough Mahmoudabadi ◽  
Nackbong Choi ◽  
Miltiadis K. Hatalis ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Low Frequency ◽  
Frequency Noise ◽  
High Current ◽  
Low Frequency Noise ◽  
Current Stress ◽  
Noise Measurements ◽  
Amorphous Ingazno
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