Electrical characterization of Al/Si ohmic contacts to heavily boron doped polycrystalline diamond films

1996 ◽  
Vol 79 (5) ◽  
pp. 2535-2541 ◽  
Author(s):  
M. Werner ◽  
C. Johnston ◽  
P. R. Chalker ◽  
S. Romani ◽  
I. M. Buckley‐Golder
1994 ◽  
Vol 3 (4-6) ◽  
pp. 618-622 ◽  
Author(s):  
Takashi Sugino ◽  
Kiyoshi Karasutani ◽  
Fumihiro Mano ◽  
Hiroya Kataoka ◽  
Junji Shirafuji ◽  
...  

1995 ◽  
Vol 4 (5-6) ◽  
pp. 678-683 ◽  
Author(s):  
R. Locher ◽  
J. Wagner ◽  
F. Fuchs ◽  
M. Maier ◽  
P. Gonon ◽  
...  

1992 ◽  
Vol 61 (15) ◽  
pp. 1832-1834 ◽  
Author(s):  
A. Masood ◽  
M. Aslam ◽  
M. A Tamor ◽  
T. J. Potter

1996 ◽  
Vol 423 ◽  
Author(s):  
J. W. Glesener ◽  
A. A. Morrish

AbstractThe field emission current from boron doped polycrystalline diamond films was characterized as a function of voltage and temperature. The motivation for the current-temperature measurements was to assess the thermal stability of the diamond emitters and gain some insight into a possible emission mechanism.Results from the current-temperature (I-T) measurements found that the field emission current appeared independent of temperature. The best characterization of the results implied a temperature independent electron tunneling mechanism if not electron emission from the valence band of diamond.


1994 ◽  
Vol 3 (4-6) ◽  
pp. 983-985 ◽  
Author(s):  
M. Werner ◽  
O. Dorsch ◽  
H.U. Baerwind ◽  
A. Ersoy ◽  
E. Obermeier ◽  
...  

2003 ◽  
Vol 18 (6) ◽  
pp. 554-559 ◽  
Author(s):  
F Moscatelli ◽  
A Scorzoni ◽  
A Poggi ◽  
G C Cardinali ◽  
R Nipoti

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