Radio‐frequency bias effects on SiO2films deposited by distributed electron cyclotron resonance plasma enhanced chemical vapor deposition

1994 ◽  
Vol 76 (3) ◽  
pp. 1847-1855 ◽  
Author(s):  
N. Jiang ◽  
B. Agius ◽  
M. C. Hugon ◽  
J. Olivier ◽  
M. Puech
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