Characteristics of amorphous and polycrystalline silicon films deposited at 120 °C by electron cyclotron resonance plasma-enhanced chemical vapor deposition

1998 ◽  
Vol 16 (3) ◽  
pp. 1912-1916 ◽  
Author(s):  
Sanghoon Bae ◽  
A. Kaan Kalkan ◽  
Shangcong Cheng ◽  
Stephen J. Fonash
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