The generalized transmission matrix for electron‐wave‐optics through biased heterostructures: Quantum device applications

1994 ◽  
Vol 75 (1) ◽  
pp. 351-356 ◽  
Author(s):  
A. M. Kan’an ◽  
A. Puri
Keyword(s):  
Transmission Matrix ◽  
Wave Optics ◽  
Electron Wave ◽  
Quantum Device ◽  
Device Applications

BeTe/Si heterostructures for MIS and quantum device applications

1999 ◽  
Vol 10 (2) ◽  
pp. 187-191 ◽  
Author(s):  
Shan Jiang ◽  
Pedro Barrios ◽  
Robert T Bate ◽  
Wiley P Kirk
Keyword(s):  
Quantum Device ◽  
Device Applications

Electron wave optics in semiconductors

1989 ◽  
Vol 65 (2) ◽  
pp. 814-820 ◽  
Author(s):  
T. K. Gaylord ◽  
K. F. Brennan
Keyword(s):  
Wave Optics ◽  
Electron Wave

Erratum: ‘‘Electron wave optics in semiconductors’’ [J. Appl. Phys. 65, 814 (1989)]

1989 ◽  
Vol 65 (11) ◽  
pp. 4461-4461
Author(s):  
T. K. Gaylord ◽  
K. F. Brennan
Keyword(s):  
Wave Optics ◽  
Electron Wave

High-Voltage Scanning Electron Microscopy

1970 ◽  
Vol 28 ◽  
pp. 6-7
Author(s):  
J. M. Cowley
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Scanning Transmission Electron Microscopy ◽  
Wave Optics ◽  
Contrast Effects ◽  
Transmission Electron ◽  
Mode Of Operation ◽  
Scanning Transmission ◽  
Types Of Information ◽  
Voltage Scanning

The comparison of scanning transmission electron microscopy (STEM) with conventional transmission electron microscopy (CTEM) can best be made by means of the Reciprocity Theorem of wave optics. In Fig. 1 the intensity measured at a point A’ in the CTEM image due to emission from a point B’ in the electron source is equated to the intensity at a point of the detector, B, due to emission from a point A In the source In the STEM. On this basis it can be demonstrated that contrast effects In the two types of instrument will be similar. The reciprocity relationship can be carried further to include the Instrument design and experimental procedures required to obtain particular types of information. For any. mode of operation providing particular information with one type of microscope, the analagous type of operation giving the same information can be postulated for the other type of microscope. Then the choice between the two types of instrument depends on the practical convenience for obtaining the required Information.

Object Wave Determination by Single-Sideband Methods

1973 ◽  
Vol 31 ◽  
pp. 266-267
Author(s):  
Kenneth H. Downing ◽  
Benjamin M. Siegel
Keyword(s):  
Phase Shift ◽  
Carbon Films ◽  
Object Wave ◽  
Electron Wave ◽  
Phase Object ◽  
Heavy Atoms ◽  
Single Sideband ◽  
Thin Carbon ◽  
Additional Phase Shift ◽  
Additional Phase

Under the “weak phase object” approximation, the component of the electron wave scattered by an object is phase shifted by π/2 with respect to the unscattered component. This phase shift has been confirmed for thin carbon films by many experiments dealing with image contrast and the contrast transfer theory. There is also an additional phase shift which is a function of the atomic number of the scattering atom. This shift is negligible for light atoms such as carbon, but becomes significant for heavy atoms as used for stains for biological specimens. The light elements are imaged as phase objects, while those atoms scattering with a larger phase shift may be imaged as amplitude objects. There is a great deal of interest in determining the complete object wave, i.e., both the phase and amplitude components of the electron wave leaving the object.

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