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J. C. Hsieh ◽  
Y. K. Fang ◽  
C. W. Chen ◽  
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M. S. Lin ◽  
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Metal Oxide ◽  
Interface States ◽  
Metal Oxide Semiconductor ◽  
Oxide Semiconductor ◽  
Semiconductor Structures

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2002 ◽  
Vol 80 (24) ◽  
pp. 4597-4599 ◽  
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F. Crupi ◽  
C. Ciofi ◽  
A. Germanò ◽  
G. Iannaccone ◽  
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...  
Keyword(s):  
Metal Oxide ◽  
Low Voltage ◽  
Interface States ◽  
Metal Oxide Semiconductor ◽  
Oxide Semiconductor ◽  
Leakage Currents ◽  
Semiconductor Structures

Interface/border trap characterization of Al2O3/AlN/GaN metal-oxide-semiconductor structures with an AlN interfacial layer

2015 ◽  
Vol 106 (5) ◽  
pp. 051605 ◽  
Author(s):  
Shenghou Liu ◽  
Shu Yang ◽  
Zhikai Tang ◽  
Qimeng Jiang ◽  
Cheng Liu ◽  
...  
Keyword(s):  
Metal Oxide ◽  
Interfacial Layer ◽  
Metal Oxide Semiconductor ◽  
Oxide Semiconductor ◽  
Semiconductor Structures
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