A Tougaard background deconvolution study of the compositional depth profile in amorphousa‐Si1−xCx:H alloys

1993 ◽  
Vol 73 (2) ◽  
pp. 767-770 ◽  
Author(s):  
Murali Sastry ◽  
S. R. Sainkar
Keyword(s):  
Depth Profile ◽  
Compositional Depth Profile

Depth Profile Study of Large-Sized Coal Samples by Fourier Transform Infrared Photoacoustic Spectroscopy

1986 ◽  
Vol 40 (2) ◽  
pp. 214-217 ◽  
Author(s):  
Tiziana Zerlia
Keyword(s):  
Fourier Transform ◽  
Depth Profile ◽  
Photoacoustic Spectroscopy ◽  
Modulation Frequency ◽  
Fourier Transform Infrared ◽  
Qualitative Description ◽  
Difference Spectra ◽  
Compositional Depth Profile ◽  
Ft Ir ◽  
Infrared Photoacoustic Spectroscopy

A multidisciplinary approach is demonstrated to elucidate coal weathering at a molecular level. Fourier Transform Infrared Photoacoustic Spectroscopy (FT-IR/PAS) provides a technique for a compositional depth profile of coal by simply varying the modulation frequency (mirror velocity) of the light impinging upon the solid surface. In order that the potential of this technique in this field could be evaluated, large-sized coal samples were examined. The PA difference spectra obtained from the spectra taken at different modulation frequencies (i.e., different depths), on a sample aged in air, demonstrate the appearance of negative features in the CH infrared absorption which are indicative of a coal alteration. Therefore, different coal layers can be distinguished by FT-IR/PAS. The application of the same technique to the study of a coal sample heated in air at 200°C allows the detection of different oxidation mechanisms operating inside and outside the coal. Although quantitative results are difficult to obtain, the technique can be successfully proposed for a qualitative description of coal weathering.

Raman Spectroscopic Evaluation of Silicides Formed with A Scanned Electron Beam

1980 ◽  
Vol 1 ◽  
Author(s):  
R. J. Nemanich ◽  
T. W. Sigmon ◽  
N. M. Johnson ◽  
M. D. Moyer ◽  
S. S. Lau
Keyword(s):  
Crystal Structure ◽  
Thin Films ◽  
Electron Beam ◽  
Raman Scattering ◽  
Depth Profile ◽  
Rutherford Backscattering ◽  
Raman Spectroscopic ◽  
Compositional Depth Profile

ABSTRACTRaman scattering and Rutherford backscattering are used to study the products of SEM processing of Pd and Pt thin films on Si(100) substrates. The RBS measurements indicate the compositional depth profile of the resulting silicide while the Raman scattering indicates the crystal structure. For both cases it is found that the resultant silicide is dominated by Pd2 Si (or Pt2Si) structures but evidence of deviations are also noted.

A New Procedure of Formation of Multicolor Passive Films on Titanium:  Compositional Depth Profile Analysis

Langmuir ◽  
1996 ◽  
Vol 12 (4) ◽  
pp. 1005-1010 ◽  
Author(s):  
Gregory Jerkiewicz ◽  
Henryk Strzelecki ◽  
Andrzej Wieckowski
Keyword(s):  
Depth Profile ◽  
Profile Analysis ◽  
Passive Films ◽  
Depth Profile Analysis ◽  
Compositional Depth Profile

A case study for XPD in the presence of a compositional depth profile: interface formation between metals (Ag, Al) and HgCdTe

1993 ◽  
Vol 287-288 ◽  
pp. 495-501 ◽  
Author(s):  
M. Seelmann-Eggebert ◽  
G.P. Carey ◽  
R. Klauser ◽  
H.J. Richter
Keyword(s):  
Depth Profile ◽  
Interface Formation ◽  
Compositional Depth Profile
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