scholarly journals Publisher’s Note: “Application of electron backscatter diffraction to the study on orientation distribution of intermetallic compounds at heterogeneous interfaces (Sn/Ag and Sn/Cu)” [J. Appl. Phys. 108, 103518 (2010)]

2011 ◽  
Vol 109 (2) ◽  
pp. 029903 ◽  
Author(s):  
H. F. Zou ◽  
Z. F. Zhang
Keyword(s):  
Intermetallic Compounds ◽  
Electron Backscatter Diffraction ◽  
Orientation Distribution ◽  
Heterogeneous Interfaces ◽  
Electron Backscatter ◽  
Backscatter Diffraction

An Investigation of Microtexture Evolution in an AlMgSi Alloy Processed by High-Pressure Torsion

2011 ◽  
Vol 702-703 ◽  
pp. 165-168 ◽  
Author(s):  
Aicha Loucif ◽  
Thierry Baudin ◽  
François Brisset ◽  
Roberto B. Figueiredo ◽  
Rafik Chemam ◽  
...  
Keyword(s):  
Grain Size ◽  
High Pressure ◽  
Distribution Function ◽  
High Pressure Torsion ◽  
Electron Backscatter Diffraction ◽  
Orientation Distribution ◽  
Homogeneous Microstructure ◽  
Electron Backscatter ◽  
Backscatter Diffraction ◽  
Almgsi Alloy

This investigation uses electron backscatter diffraction (EBSD) to study the development of microtexture with increasing deformation in an AlMgSi alloy having an initial grain size of about 150 µm subjected to high pressure torsion (HPT) up to a total of 5 turns. An homogeneous microstructure was achieved throughout the disc sample at high strains with the formation of ultra-fine grains. Observations based on orientation distribution function (ODF) calculation reveals the presence of the torsion texture components often reported in the literature for f.c.c. materials. In particular, the C {001}<110> component was found to be dominant. Furthermore, no significant change in the texture sharpness was observed by increasing the strain.

Inferential statistics of electron backscatter diffraction data from within individual crystalline grains

2010 ◽  
Vol 43 (6) ◽  
pp. 1338-1355 ◽  
Author(s):  
Florian Bachmann ◽  
Ralf Hielscher ◽  
Peter E. Jupp ◽  
Wolfgang Pantleon ◽  
Helmut Schaeben ◽  
...  
Keyword(s):  
Electron Backscatter Diffraction ◽  
Orientation Distribution ◽  
Numerical Determination ◽  
Spatial Statistical Analysis ◽  
Spatial Reference ◽  
Electron Backscatter ◽  
The Mean ◽  
Backscatter Diffraction ◽  
Crystallographic Orientations

Highly concentrated distributed crystallographic orientation measurements within individual crystalline grains are analysed by means of ordinary statistics neglecting their spatial reference. Since crystallographic orientations are modelled as left cosets of a given subgroup of SO(3), the non-spatial statistical analysis adapts ideas borrowed from the Bingham quaternion distribution on {\bb S}^3. Special emphasis is put on the mathematical definition and the numerical determination of a `mean orientation' characterizing the crystallographic grain as well as on distinguishing several types of symmetry of the orientation distribution with respect to the mean orientation, like spherical, prolate or oblate symmetry. Applications to simulated as well as to experimental data are presented. All computations have been done with the free and open-source texture toolboxMTEX.

scholarly journals A multivariate grain size and orientation distribution function: derivation from electron backscatter diffraction data and applications

2021 ◽  
Vol 54 (1) ◽  
Author(s):  
Jesús Galán López ◽  
Leo A. I. Kestens
Keyword(s):  
Grain Size ◽  
Distribution Function ◽  
Orientation Distribution Function ◽  
Diffraction Data ◽  
Electron Backscatter Diffraction ◽  
Orientation Distribution ◽  
Formation Mechanisms ◽  
Electron Backscatter ◽  
Backscatter Diffraction ◽  
Grain Size And Orientation

Two of the microstructural parameters most influential in the properties of polycrystalline materials are grain size and crystallographic texture. Although both properties have been extensively studied and there are a wide range of analysis tools available, they are generally considered independently, without taking into account the possible correlations between them. However, there are reasons to assume that grain size and orientation are correlated microstructural state variables, as they are the result of single microstructural formation mechanisms occurring during material processing. In this work, the grain size distribution and orientation distribution functions are combined in a single multivariate grain size orientation distribution function (GSODF). In addition to the derivation of the function, several examples of practical applications to low carbon steels are presented, in which it is shown how the GSODF can be used in the analysis of 2D and 3D electron backscatter diffraction data, as well as in the generation of representative volume elements for full-field models and as input in simulations using mean-field methods.

A Dictionary Approach to Electron Backscatter Diffraction Indexing

2015 ◽  
Vol 21 (3) ◽  
pp. 739-752 ◽  
Author(s):  
Yu H. Chen ◽  
Se Un Park ◽  
Dennis Wei ◽  
Greg Newstadt ◽  
Michael A. Jackson ◽  
...  
Keyword(s):  
Electron Backscatter Diffraction ◽  
Orientation Distribution ◽  
Polycrystalline Materials ◽  
Dictionary Matching ◽  
Binary Decision Tree ◽  
Electron Backscatter ◽  
Dense Grid ◽  
The Mean ◽  
Von Mises ◽  
Backscatter Diffraction

AbstractWe propose a framework for indexing of grain and subgrain structures in electron backscatter diffraction patterns of polycrystalline materials. We discretize the domain of a dynamical forward model onto a dense grid of orientations, producing a dictionary of patterns. For each measured pattern, we identify the most similar patterns in the dictionary, and identify boundaries, detect anomalies, and index crystal orientations. The statistical distribution of these closest matches is used in an unsupervised binary decision tree (DT) classifier to identify grain boundaries and anomalous regions. The DT classifies a pattern as an anomaly if it has an abnormally low similarity to any pattern in the dictionary. It classifies a pixel as being near a grain boundary if the highly ranked patterns in the dictionary differ significantly over the pixel’s neighborhood. Indexing is accomplished by computing the mean orientation of the closest matches to each pattern. The mean orientation is estimated using a maximum likelihood approach that models the orientation distribution as a mixture of Von Mises–Fisher distributions over the quaternionic three sphere. The proposed dictionary matching approach permits segmentation, anomaly detection, and indexing to be performed in a unified manner with the additional benefit of uncertainty quantification.

Cross Section Analysis of Cu Filled TSVs Based on High Throughput Plasma-FIB Milling

2012 ◽  
Author(s):  
Frank Altmann ◽  
Jens Beyersdorfer ◽  
Jan Schischka ◽  
Michael Krause ◽  
German Franz ◽  
...  
Keyword(s):  
High Resolution ◽  
Cross Section ◽  
High Throughput ◽  
Cross Sections ◽  
Electron Backscatter Diffraction ◽  
Grain Structure ◽  
Electron Backscatter ◽  
Section Surface ◽  
Backscatter Diffraction ◽  
Section Analysis

Abstract In this paper the new Vion™ Plasma-FIB system, developed by FEI, is evaluated for cross sectioning of Cu filled Through Silicon Via (TSV) interconnects. The aim of the study presented in this paper is to evaluate and optimise different Plasma-FIB (P-FIB) milling strategies in terms of performance and cross section surface quality. The sufficient preservation of microstructures within cross sections is crucial for subsequent Electron Backscatter Diffraction (EBSD) grain structure analyses and a high resolution interface characterisation by TEM.

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