Micro‐Raman study on GaAs layers directly grown on (100) Si by molecular beam epitaxy

1992 ◽  
Vol 72 (6) ◽  
pp. 2531-2533 ◽  
Author(s):  
Akira Ito ◽  
Masaya Ichimura ◽  
Akira Usami ◽  
Takao Wada ◽  
Hirayuki Kano
2001 ◽  
Vol 10 (4) ◽  
pp. 587-592 ◽  
Author(s):  
G. Zanelato ◽  
Yu.A. Pusep ◽  
J.C. Galzerani ◽  
D.I. Lubyshev ◽  
P.P. González-Borrero

1992 ◽  
Vol 31 (Part 2, No. 2B) ◽  
pp. L186-L188 ◽  
Author(s):  
Akira Yamada ◽  
Nobuaki Kojima ◽  
Kiyoshi Takahashi ◽  
Tamotsu Okamoto ◽  
Makoto Konagai

1990 ◽  
Vol 19 (11) ◽  
pp. 1323-1330 ◽  
Author(s):  
R. S. Berg ◽  
Nergis Mavalvala ◽  
Tracie Steinberg ◽  
F. W. Smith

1989 ◽  
Vol 160 ◽  
Author(s):  
J. Geurts ◽  
J. Finders ◽  
H. Münder ◽  
M. Kamp ◽  
M. Oehlers ◽  
...  

AbstractThe crystalline quality of the transition region between buffer layer and epilayer in MOMBE (metalorganic molecular beam epitaxy) and plasma-MOVPE (metalorganic vapour phase epitaxy) grown GaAs layers on Si(100) is analysed by Raman scattering with variation of the penetration depth and besides bevel polishing or step etching. The region with considerable lattice imperfections is essentially confined to the original buffer layer.


Author(s):  
C.B. Carter ◽  
D.M. DeSimone ◽  
T. Griem ◽  
C.E.C. Wood

Molecular-beam epitaxy (MBE) is potentially an extremely valuable tool for growing III-V compounds. The value of the technique results partly from the ease with which controlled layers of precisely determined composition can be grown, and partly from the ability that it provides for growing accurately doped layers.


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