Study on polished and etched surfaces of polar (111) CdTe by x‐ray photoelectron spectroscopy and grazing‐incidence x‐ray diffraction

1992 ◽  
Vol 71 (10) ◽  
pp. 5212-5216 ◽  
Author(s):  
T. B. Wu ◽  
J. S. Chen ◽  
C. D. Chiang ◽  
Y. M. Pang ◽  
S. J. Yang
Keyword(s):  
Photoelectron Spectroscopy ◽  
Grazing Incidence ◽  
X Ray Diffraction ◽  
X Ray

scholarly journals Surface Stoichiometry and Depth Profile of Tix-CuyNz Thin Films Deposited by Magnetron Sputtering

Materials ◽  
2021 ◽  
Vol 14 (12) ◽  
pp. 3191
Author(s):  
Arun Kumar Mukhopadhyay ◽  
Avishek Roy ◽  
Gourab Bhattacharjee ◽  
Sadhan Chandra Das ◽  
Abhijit Majumdar ◽  
...  
Keyword(s):  
Magnetron Sputtering ◽  
Photoelectron Spectroscopy ◽  
Film Surface ◽  
Grazing Incidence ◽  
X Ray Diffraction ◽  
X Ray ◽  
Relative Composition ◽  
Transmission Electron ◽  
Deposited Film ◽  
Deposited Films

We report the surface stoichiometry of Tix-CuyNz thin film as a function of film depth. Films are deposited by high power impulse (HiPIMS) and DC magnetron sputtering (DCMS). The composition of Ti, Cu, and N in the deposited film is investigated by X-ray photoelectron spectroscopy (XPS). At a larger depth, the relative composition of Cu and Ti in the film is increased compared to the surface. The amount of adventitious carbon which is present on the film surface strongly decreases with film depth. Deposited films also contain a significant amount of oxygen whose origin is not fully clear. Grazing incidence X-ray diffraction (GIXD) shows a Cu3N phase on the surface, while transmission electron microscopy (TEM) indicates a polycrystalline structure and the presence of a Ti3CuN phase.

EPITAXY OF ULTRATHIN CoO FILMS STUDIED BY XPD AND GIXRD

2002 ◽  
Vol 09 (02) ◽  
pp. 937-941 ◽  
Author(s):  
P. LUCHES ◽  
C. GIOVANARDI ◽  
T. MOIA ◽  
S. VALERI ◽  
F. BRUNO ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Lattice Constant ◽  
Photoelectron Spectroscopy ◽  
Grazing Incidence ◽  
X Ray Diffraction ◽  
Direction Parallel ◽  
X Ray ◽  
Photoelectron Diffraction ◽  
Rocksalt Structure ◽  
Plane Lattice

CoO layers have been grown by exposing to oxygen the (001) body-centered-tetragonal (bct) surface of a Co ultrathin film epitaxially grown on Fe(001). Different oxide thicknesses in the 2–15 ML range have been investigated by means of synchrotron-radiation-based techniques. X-ray photoelectron spectroscopy has been used to check the formation of the oxide films; X ray photoelectron diffraction has given information concerning the symmetry of their unit cell; grazing incidence X-ray diffraction has allowed to evaluate precisely their in-plane lattice constant. The films show a CoO(001) rocksalt structure, rotated by 45° with respect to the bct Co substrate, with the [100] direction parallel to the substrate [110] direction. Their in-plane lattice constant increases as a function of thickness, to release the in-plane strain due to the 3% mismatch between the bulk CoO phase and the underlying substrate.

scholarly journals Structure-Dependent Mechanical Properties of ALD-Grown Nanocrystalline BiFeO3Multiferroics

2016 ◽  
Vol 2016 ◽  
pp. 1-7 ◽  
Author(s):  
Anna Majtyka ◽  
Anna Nowak ◽  
Benoît Marchand ◽  
Dariusz Chrobak ◽  
Mikko Ritala ◽  
...  
Keyword(s):  
Mechanical Properties ◽  
Photoelectron Spectroscopy ◽  
Present Report ◽  
Structural Evolution ◽  
Atomic Layer ◽  
Grazing Incidence ◽  
X Ray Diffraction ◽  
X Ray ◽  
Layer Deposition ◽  
Pertinent Information

The present paper pertains to mechanical properties and structure of nanocrystalline multiferroic BeFiO3(BFO) thin films, grown by atomic layer deposition (ALD) on the Si/SiO2/Pt substrate. The usage of sharp-tip-nanoindentation and multiple techniques of structure examination, namely, grazing incidence X-ray diffraction, X-ray photoelectron spectroscopy, scanning electron microscopy, and energy dispersive X-ray spectrometry, enabled us to detect changes in elastic properties(95 GPa≤E≤118 GPa)and hardness(4.50 GPa≤H≤7.96 GPa)of BFO after stages of annealing and observe their relation to the material’s structural evolution. Our experiments point towards an increase in structural homogeneity of the samples annealed for a longer time. To our best knowledge, the present report constitutes the first disclosure of nanoindentation mechanical characteristics of ALD-fabricated BeFiO3, providing a new insight into the phenomena that accompany structure formation and development of nanocrystalline multiferroics. We believe that our systematic characterization of the BFO layers carried out at consecutive stages of their deposition provides pertinent information which is needed to control and optimize its ALD fabrication.

scholarly journals Diamond beamline I07: a beamline for surface and interface diffraction

2016 ◽  
Vol 23 (5) ◽  
pp. 1245-1253 ◽  
Author(s):  
Chris Nicklin ◽  
Tom Arnold ◽  
Jonathan Rawle ◽  
Adam Warne
Keyword(s):  
Photoelectron Spectroscopy ◽  
Accurate Determination ◽  
Ultrahigh Vacuum ◽  
Grazing Incidence ◽  
X Rays ◽  
Scanning Tunnelling Microscope ◽  
X Ray Diffraction ◽  
Double Crystal ◽  
X Ray ◽  
Wide Range

Beamline I07 at Diamond Light Source is dedicated to the study of the structure of surfaces and interfaces for a wide range of sample types, from soft matter to ultrahigh vacuum. The beamline operates in the energy range 8–30 keV and has two endstations. The first houses a 2+3 diffractometer, which acts as a versatile platform for grazing-incidence techniques including surface X-ray diffraction, grazing-incidence small- (and wide-) angle X-ray scattering, X-ray reflectivity and grazing-incidence X-ray diffraction. A method for deflecting the X-rays (a double-crystal deflector) has been designed and incorporated into this endstation, extending the surfaces that can be studied to include structures formed on liquid surfaces or at liquid–liquid interfaces. The second experimental hutch contains a similar diffractometer with a large environmental chamber mounted on it, dedicated toin situultrahigh-vacuum studies. It houses a range of complementary surface science equipment including a scanning tunnelling microscope, low-energy electron diffraction and X-ray photoelectron spectroscopy ensuring that correlations between the different techniques can be performed on the same sample, in the same chamber. This endstation allows accurate determination of well ordered structures, measurement of growth behaviour during molecular beam epitaxy and has also been used to measure coherent X-ray diffraction from nanoparticles during alloying.

Microstructural Investigations of Hafnium Aluminum Oxide Films

2008 ◽  
Vol 1074 ◽  
Author(s):  
Doina Craciun ◽  
Gabriel Socol ◽  
Emanuel Axente ◽  
Aurelian-Catalin Galca ◽  
Rajiv Singh ◽  
...  
Keyword(s):  
Thermal Stability ◽  
Phase Composition ◽  
Photoelectron Spectroscopy ◽  
Pulsed Laser ◽  
Grazing Incidence ◽  
Laser Deposition ◽  
Deposition Technique ◽  
X Ray Diffraction ◽  
X Ray ◽  
Thermal Stability Of

ABSTRACTThe crystalline structure, composition, chemical bonding and thermal stability of HfO2-Al2O3 mixtures deposited on Si using a combinatorial pulsed laser deposition technique were investigated. After deposition some films were annealed at temperatures from 850 to 950 °C for 6 or 12 minutes. Grazing incidence x-ray diffraction investigations were performed to asses the crystallinity and thermal stability of the annealed layers. Measurements of the Al to Hf ratios were performed using energy dispersive x-ray spectroscopy and x-ray photoelectron spectroscopy. From simulations of the x-ray reflectivity and spectroscopic ellipsometry spectra the phase composition and thickness of the films was calculated and then the Al to Hf ratios. Al/Hf values of 1 and 8 were found to be necessary to block the crystallization of the films after anneals at 850 and 950 °C, respectively.

scholarly journals Crystallization dynamics and interface stability of strontium titanate thin films on silicon

2015 ◽  
Vol 48 (2) ◽  
pp. 393-400 ◽  
Author(s):  
Florian Hanzig ◽  
Juliane Hanzig ◽  
Erik Mehner ◽  
Carsten Richter ◽  
Jozef Veselý ◽  
...  
Keyword(s):  
Thin Films ◽  
Strontium Titanate ◽  
Photoelectron Spectroscopy ◽  
Physical Vapor Deposition ◽  
Grazing Incidence ◽  
Atmospheric Conditions ◽  
X Ray Diffraction ◽  
Heating Rates ◽  
X Ray ◽  
Crystallization Dynamics

Different physical vapor deposition methods have been used to fabricate strontium titanate thin films. Within the binary phase diagram of SrO and TiO2the stoichiometry ranges from Ti rich to Sr rich, respectively. The crystallization of these amorphous SrTiO3layers is investigated byin situgrazing-incidence X-ray diffraction using synchrotron radiation. The crystallization dynamics and evolution of the lattice constants as well as crystallite sizes of the SrTiO3layers were determined for temperatures up to 1223 K under atmospheric conditions applying different heating rates. At approximately 473 K, crystallization of perovskite-type SrTiO3is initiated for Sr-rich electron beam evaporated layers, whereas Sr-depleted sputter-deposited thin films crystallize at 739 K. During annealing, a significant diffusion of Si from the substrate into the SrTiO3layers occurs in the case of Sr-rich composition. This leads to the formation of secondary silicate phases which are observed by X-ray diffraction, transmission electron microscopy and X-ray photoelectron spectroscopy.

INFLUENCE OF SUBSTRATE TEMPERATURE ON THE COMPOSITION, ELECTRICAL RESISTIVITY AND INFRARED EMISSIVITY OF PtOx FILMS

2019 ◽  
Vol 26 (09) ◽  
pp. 1950056
Author(s):  
WENBO KANG ◽  
DONGMEI ZHU ◽  
XIAOKE LU ◽  
ZHIBIN HUANG ◽  
WANCHENG ZHOU ◽  
...  
Keyword(s):  
Electrical Resistivity ◽  
Substrate Temperature ◽  
Photoelectron Spectroscopy ◽  
Grazing Incidence ◽  
Infrared Emissivity ◽  
X Ray Diffraction ◽  
X Ray ◽  
Structure Morphology ◽  
Influence Of Substrate ◽  
Substrate Temperatures

PtOx films were deposited by direct current (DC) reactive magnetron sputtering in Ar/O2 mixture atmosphere at substrate temperatures ranging from 200∘C to 400∘C. The influence of substrate temperature on the structure, morphology, composition, electrical resistivity and infrared emissivity of PtOx films was studied. The X-ray photoelectron spectroscopy (XPS) and grazing incidence X-ray diffraction (GIXRD) results revealed that the as-deposited amorphous PtOx films were mainly composed of PtO and PtO2 phases. It was found that with the increase in the substrate temperature, the proportion of PtO phase in the films increased, while the electrical resistivity and infrared emissivity of the films decreased with the increasing substrate temperature.

scholarly journals Graded bulk-heterojunction enables 17% binary organic solar cells via nonhalogenated open air coating

2021 ◽  
Vol 12 (1) ◽  
Author(s):  
Ying Zhang ◽  
Kuan Liu ◽  
Jiaming Huang ◽  
Xinxin Xia ◽  
Jiupeng Cao ◽  
...  
Keyword(s):  
Solar Cells ◽  
Phase Separation ◽  
Organic Solar Cells ◽  
Photoelectron Spectroscopy ◽  
Bulk Heterojunction ◽  
Depth Profiling ◽  
Grazing Incidence ◽  
X Ray Diffraction ◽  
X Ray ◽  
Xrd Techniques

AbstractGraded bulk-heterojunction (G-BHJ) with well-defined vertical phase separation has potential to surpass classical BHJ in organic solar cells (OSCs). In this work, an effective G-BHJ strategy via nonhalogenated solvent sequential deposition is demonstrated using nonfullerene acceptor (NFA) OSCs. Spin-coated G-BHJ OSCs deliver an outstanding 17.48% power conversion efficiency (PCE). Depth-profiling X-ray photoelectron spectroscopy (DP-XPS) and angle-dependent grazing incidence X-ray diffraction (GI-XRD) techniques enable the visualization of polymer/NFA composition and crystallinity gradient distributions, which benefit charge transport, and enable outstanding thick OSC PCEs (16.25% for 300 nm, 14.37% for 500 nm), which are among the highest reported. Moreover, the nonhalogenated solvent enabled G-BHJ OSC via open-air blade coating and achieved a record 16.77% PCE. The blade-coated G-BHJ has drastically different D-A crystallization kinetics, which suppresses the excessive aggregation induced unfavorable phase separation in BHJ. All these make G-BHJ a feasible and promising strategy towards highly efficient, eco- and manufacture friendly OSCs.

Ètude des interfaces SiO2/TiO2 et TiO2/SiO2 dans la structure SiO2/TiO2/SiO2/c-Si préparée par pulvérisation cathodique radio fréquence

2007 ◽  
Vol 85 (7) ◽  
pp. 763-776
Author(s):  
K Hafidi ◽  
M Azizan ◽  
Y Ijdiyaou ◽  
E L Ameziane
Keyword(s):  
Photoelectron Spectroscopy ◽  
Grazing Incidence ◽  
Interface State ◽  
Concentration Profiles ◽  
X Ray Diffraction ◽  
X Ray ◽  
Interfacial Layers ◽  
Surface And Interface ◽  
Crystalline Substrate ◽  
Complementary Techniques

The atomic structure of the TiO2/SiO2 and SiO2/TiO2 interfaces has been investigated in SiO2/TiO2/SiO2 multilayers deposited by radio frequency reactive sputtering without breaking the vacuum on the crystalline substrate cooled by water. The characterizations of these interfaces have been performed using three complementary techniques sensitive to surface and interface state: X-ray photoelectron spectroscopy (XPS), grazing incidence X-ray diffraction (GIXD), and specular X-ray reflectometry (GIXR). The concentration profiles and Si2p and O1s core level chemical displacements show that TiO2/SiO2 and SiO2/TiO2 interfaces are very diffuse. The reflectometry measurements confirm this character and indicate that the silicon, titanium, and oxygen atomic concentrations vary gradually at the interfaces. The grazing incidence X-ray spectra indicates that the interfacial layers are not well crystallized and are formed by SiO2-TiO2, TiO, Ti2O3, Ti3O5, Ti5Si3, Ti5Si4, TiSi, and TiSi2 components.

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