Crystallographic characterization of GexSi1−x/Si superlattices grown by remote plasma‐enhanced chemical vapor deposition
2005 ◽
Vol 44
(10)
◽
pp. 7267-7270
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1996 ◽
Vol 14
(4)
◽
pp. 2660
◽
1998 ◽
Vol 317
(1-2)
◽
pp. 149-152
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1989 ◽
Vol 7
(4)
◽
pp. 2554-2561
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1989 ◽
Vol 7
(3)
◽
pp. 1130-1135
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1991 ◽
Vol 137-138
◽
pp. 741-744
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2004 ◽
Vol 43
(No. 11A)
◽
pp. L1452-L1454
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