Temperature dependence of minority‐carrier lifetime in iron‐diffusedp‐type silicon wafers

1991 ◽  
Vol 69 (5) ◽  
pp. 3077-3081 ◽  
Author(s):  
Y. Hayamizu ◽  
T. Hamaguchi ◽  
S. Ushio ◽  
T. Abe ◽  
F. Shimura
Keyword(s):  
Temperature Dependence ◽  
Carrier Lifetime ◽  
Minority Carrier ◽  
Minority Carrier Lifetime ◽  
Silicon Wafers ◽  
Type Silicon

The effect of oxide precipitates on minority carrier lifetime in p-type silicon

2011 ◽  
Vol 110 (5) ◽  
pp. 053713 ◽  
Author(s):  
J. D. Murphy ◽  
K. Bothe ◽  
M. Olmo ◽  
V. V. Voronkov ◽  
R. J. Falster
Keyword(s):  
Carrier Lifetime ◽  
Minority Carrier ◽  
Minority Carrier Lifetime ◽  
Type Silicon ◽  
P Type

On the Measurement of Minority Carrier Lifetime in n-Type Silicon

1955 ◽  
Vol 68 (3) ◽  
pp. 121-129 ◽  
Author(s):  
J B Arthur ◽  
W Bardsley ◽  
A F Gibson ◽  
C A Hogarth
Keyword(s):  
Carrier Lifetime ◽  
Minority Carrier ◽  
Minority Carrier Lifetime ◽  
Type Silicon

Minority carrier lifetime scan map in crystalline silicon wafers

1999 ◽  
Vol 70 (10) ◽  
pp. 4044-4046 ◽  
Author(s):  
J. Gervais ◽  
O. Palais ◽  
L. Clerc ◽  
S. Martinuzzi
Keyword(s):  
Carrier Lifetime ◽  
Minority Carrier ◽  
Crystalline Silicon ◽  
Minority Carrier Lifetime ◽  
Silicon Wafers

Minority carrier lifetime in silicon wafers from quasi-steady-state photoluminescence

2010 ◽  
Vol 97 (9) ◽  
pp. 092109 ◽  
Author(s):  
J. A. Giesecke ◽  
M. C. Schubert ◽  
D. Walter ◽  
W. Warta
Keyword(s):  
Steady State ◽  
Carrier Lifetime ◽  
Minority Carrier ◽  
Minority Carrier Lifetime ◽  
Silicon Wafers ◽  
Quasi Steady State

scholarly journals Minority-carrier lifetime and defect content of n-type silicon grown by the noncontact crucible method

2014 ◽  
Vol 407 ◽  
pp. 31-36 ◽  
Author(s):  
Maulid Kivambe ◽  
Douglas M. Powell ◽  
Sergio Castellanos ◽  
Mallory Ann Jensen ◽  
Ashley E. Morishige ◽  
...  
Keyword(s):  
Carrier Lifetime ◽  
Minority Carrier ◽  
Minority Carrier Lifetime ◽  
Type Silicon ◽  
Defect Content
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