X-ray characterization of composition and relaxation of AlxGa1−xN(0≤x≤1) layers grown on GaN/sapphire templates by low pressure organometallic vapor phase epitaxy
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1994 ◽
Vol 23
(2)
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pp. 159-166
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1995 ◽
Vol 30
(2-3)
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pp. 99-108
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1990 ◽
Vol 19
(11)
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pp. 1313-1317
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2000 ◽
Vol 7
(3-4)
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pp. 855-859
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1994 ◽
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