X‐ray optics of doubly curved diffractors

D. B. Wittry; Songquan Sun

doi:10.1063/1.345629

X‐ray optics of doubly curved diffractors

Journal of Applied Physics ◽

10.1063/1.345629 ◽

1990 ◽

Vol 67 (4) ◽

pp. 1633-1638 ◽

Cited By ~ 36

Author(s):

D. B. Wittry ◽

Songquan Sun

Keyword(s):

Ray Optics ◽

X Ray ◽

Doubly Curved

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Doubly curved crystal (DCC) X-ray optics and applications

Powder Diffraction ◽

10.1154/1.1482367 ◽

2002 ◽

Vol 17 (2) ◽

pp. 99-103 ◽

Cited By ~ 14

Author(s):

Zewu Chen ◽

Walter M. Gibson

Keyword(s):

Thin Films ◽

Low Power ◽

X Rays ◽

Enabling Technology ◽

Ray Optics ◽

X Ray ◽

Composition And Structure ◽

Composition Structure ◽

Doubly Curved

Doubly curved crystal (DCC) X-ray optics provide an enabling technology for new portable, remote, and in situ applications of monochromatic X-rays for composition and structure analysis of amorphous, polycrystalline, and crystalline solids. Femtogram sensitivity for surface contamination, parts-per-billion (ppb) impurity levels for solids, and composition, structure and uniformity of thin films with compact, low power (20–50 W) source optic combinations are possible.

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Physical Analysis of High-Intensity Focusing X-ray Optics: Doubly Curved Crystals vs. Highly Focusing Polycapillaries

10.1117/12.453743 ◽

2002 ◽

Author(s):

Sarah Formica ◽

Susanne M. Lee

Keyword(s):

High Intensity ◽

Physical Analysis ◽

Ray Optics ◽

X Ray ◽

Doubly Curved ◽

Doubly Curved Crystals

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X‐ray optics of doubly curved diffractors II

Journal of Applied Physics ◽

10.1063/1.350406 ◽

1992 ◽

Vol 71 (2) ◽

pp. 564-568 ◽

Cited By ~ 17

Author(s):

D. B. Wittry ◽

Songquan Sun

Keyword(s):

Ray Optics ◽

X Ray ◽

Doubly Curved

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X-ray microprobe for materials science

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100168013 ◽

1994 ◽

Vol 52 ◽

pp. 56-57

Author(s):

G.E. Ice

Keyword(s):

Crystallographic Orientation ◽

Local Structure ◽

Materials Science ◽

Chemical Information ◽

X Ray Diffraction ◽

Ray Optics ◽

X Ray ◽

Novel Materials ◽

New Information ◽

Elemental Sensitivity

The increasing availability of synchrotron x-ray sources has stimulated the development of advanced hard x-ray (E≥5 keV) microprobes. With new x-ray optics these microprobes can achieve micron and submicron spatial resolutions. The inherent elemental and crystallographic sensitivity of an x-ray microprobe and its inherently nondestructive and penetrating nature will have important applications to materials science. For example, x-ray fluorescent microanalysis of materials can reveal elemental distributions with greater sensitivity than alternative nondestructive probes. In materials, segregation and nonuniform distributions are the rule rather than the exception. Common interfaces to whichsegregation occurs are surfaces, grain and precipitate boundaries, dislocations, and surfaces formed by defects such as vacancy and interstitial configurations. In addition to chemical information, an x-ray diffraction microprobe can reveal the local structure of a material by detecting its phase, crystallographic orientation and strain.Demonstration experiments have already exploited the penetrating nature of an x-ray microprobe and its inherent elemental sensitivity to provide new information about elemental distributions in novel materials.

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