Thickness dependence of material quality in GaAs‐on‐Si grown by metalorganic chemical vapor deposition

1988 ◽  
Vol 63 (3) ◽  
pp. 775-783 ◽  
Author(s):  
S. J. Pearton ◽  
C. R. Abernathy ◽  
R. Caruso ◽  
S. M. Vernon ◽  
K. T. Short ◽  
...  
Sign in / Sign up

Export Citation Format

Share Document