Investigations of the emittance and brightness of ion beams from an electron beam ion source of the Dresden EBIS type

2010 ◽  
Vol 81 (2) ◽  
pp. 023303 ◽  
Author(s):  
Alexandra Silze ◽  
Erik Ritter ◽  
Günter Zschornack ◽  
Andreas Schwan ◽  
Falk Ullmann
Keyword(s):  
Electron Beam ◽  
Ion Beams ◽  
Ion Source

Nucleation and Early Growth of Sputtered thin Films

1970 ◽  
Vol 28 ◽  
pp. 516-517
Author(s):  
Dudley M. Sherman ◽  
Thos. E. Hutchinson
Keyword(s):  
Thin Films ◽  
Electron Beam ◽  
Ion Beam ◽  
Ion Source ◽  
Water Cooling ◽  
Stages Of Growth ◽  
Lens Assembly ◽  
Microscope Technique ◽  
Ion Beam Sputter Deposition

The in situ electron microscope technique has been shown to be a powerful method for investigating the nucleation and growth of thin films formed by vacuum vapor deposition. The nucleation and early stages of growth of metal deposits formed by ion beam sputter-deposition are now being studied by the in situ technique.A duoplasmatron ion source and lens assembly has been attached to one side of the universal chamber of an RCA EMU-4 microscope and a sputtering target inserted into the chamber from the opposite side. The material to be deposited, in disc form, is bonded to the end of an electrically isolated copper rod that has provisions for target water cooling. The ion beam is normal to the microscope electron beam and the target is placed adjacent to the electron beam above the specimen hot stage, as shown in Figure 1.

Resonant Ionization Laser Ion Source for Radioactive Ion Beams

2009 ◽  
Author(s):  
Y. Liu ◽  
J. R. Beene ◽  
T. Gottwald ◽  
C. C. Havener ◽  
C. Mattolat ◽  
...  
Keyword(s):  
Ion Beams ◽  
Ion Source ◽  
Radioactive Ion Beams ◽  
Laser Ion Source ◽  
Resonant Ionization

Time resolving diagnostic of the compensation process of pulsed ion beams at high-intensity light ion source

2000 ◽  
Vol 71 (2) ◽  
pp. 1107-1109 ◽  
Author(s):  
A. Jakob ◽  
P-Y. Beauvais ◽  
R. Gobin ◽  
H. Klein ◽  
J-L. LeMaire ◽  
...  
Keyword(s):  
High Intensity ◽  
Ion Beams ◽  
Ion Source ◽  
Compensation Process ◽  
High Intensity Light

Mass analyzer using electron‐beam‐guiding type ion source

1979 ◽  
Vol 50 (12) ◽  
pp. 1517-1520 ◽  
Author(s):  
Tohru Kishi ◽  
Isao Yamada ◽  
Toshinori Takagi
Keyword(s):  
Electron Beam ◽  
Ion Source ◽  
Mass Analyzer

Investigations on ion beams from a high-current ion source

1997 ◽  
Vol 46 (2) ◽  
pp. 588-591 ◽  
Author(s):  
D. Ratschko ◽  
B.G. Zhou ◽  
D. Knolle ◽  
M. Glaser
Keyword(s):  
Ion Beams ◽  
Ion Source ◽  
High Current
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