A compact electron beam ion source with integrated Wien filter providing mass and charge state separated beams of highly charged ions

2009 ◽  
Vol 80 (6) ◽  
pp. 063301 ◽  
Author(s):  
M. Schmidt ◽  
H. Peng ◽  
G. Zschornack ◽  
S. Sykora
Keyword(s):  
Electron Beam ◽  
Charge State ◽  
Ion Source ◽  
Highly Charged Ions ◽  
Wien Filter ◽  
Charged Ions

New improvements on the Kansas State University cryogenic electron beam ion source, a user facility for low energy, highly charged ions

2000 ◽  
Vol 71 (2) ◽  
pp. 902-905 ◽  
Author(s):  
M. P. Stockli ◽  
K. Carnes ◽  
C. L. Cocke ◽  
B. D. DePaola ◽  
T. Ehrenreich ◽  
...  
Keyword(s):  
Electron Beam ◽  
Ion Source ◽  
Highly Charged Ions ◽  
Low Energy ◽  
State University ◽  
User Facility ◽  
Kansas State University ◽  
Charged Ions

Development of electron beam ion source for nanoprocess using highly charged ions

2005 ◽  
Vol 235 (1-4) ◽  
pp. 519-523 ◽  
Author(s):  
Makoto Sakurai ◽  
Fumiharu Nakajima ◽  
Takunori Fukumoto ◽  
Nobuyuki Nakamura ◽  
Shunsuke Ohtani ◽  
...  
Keyword(s):  
Electron Beam ◽  
Ion Source ◽  
Highly Charged Ions ◽  
Charged Ions

A miniature electron-beam ion source for in-trap creation of highly charged ions

2006 ◽  
Vol 77 (3) ◽  
pp. 03A901 ◽  
Author(s):  
J. Alonso ◽  
K. Blaum ◽  
S. Djekic ◽  
H.-J. Kluge ◽  
W. Quint ◽  
...  
Keyword(s):  
Electron Beam ◽  
Ion Source ◽  
Highly Charged Ions ◽  
Charged Ions

Precision mass measurements using a penning trap and highly charged ions produced in an electron beam ion source

1997 ◽  
Vol T71 ◽  
pp. 88-95 ◽  
Author(s):  
H Borgenstrand ◽  
C Carlberg ◽  
G Rouleau ◽  
R Schuch ◽  
F Söderberg ◽  
...  
Keyword(s):  
Electron Beam ◽  
Penning Trap ◽  
Ion Source ◽  
Highly Charged Ions ◽  
Mass Measurements ◽  
Charged Ions ◽  
Precision Mass Measurements
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