Note: Lateral force microscope calibration using multiple location pivot loading of rectangular cantilevers

2010 ◽  
Vol 81 (2) ◽  
pp. 026104 ◽  
Author(s):  
Koo-Hyun Chung ◽  
Mark G. Reitsma
Keyword(s):  
Lateral Force ◽  
Multiple Location ◽  
Lateral Force Microscope

Simultaneous Measurement of Surface Topography and Friction Force by a Single-Head Lateral Force Microscope

1995 ◽  
Vol 117 (2) ◽  
pp. 334-340 ◽  
Author(s):  
C.-J. Lu ◽  
Zhaoguo Jiang ◽  
D. B. Bogy ◽  
T. Miyamoto
Keyword(s):  
Friction Coefficient ◽  
Surface Topography ◽  
Friction Force ◽  
Rotation Angle ◽  
Point Contact ◽  
Lateral Force ◽  
Wear Depth ◽  
Optical Head ◽  
Lateral Force Microscope ◽  
Normal Deflection

Although friction force measurements using one sensor to detect both the normal deflection and rotation angle of a scanning probe are convenient and popular, the critical issues regarding the calibration of the instruments have not been fully studied. A Lateral Force Microscope (LFM), modified from the Point Contact Microscope (PCM), is used to simultaneously measure the surface topography and friction force. An optical head is used to measure the normal bending deflection and rotation angle of the cantilever that carries the diamond tip. Emphasis is put on the development of reliable calibration procedures for obtaining the normal deflection and rotation sensitivities of the optical head as well as the spring constants in the bending and torsion modes. The friction loop, which is essential for friction measurements, is investigated in detail. The LFM is used to measure a two-phase composite to show its ability to distinguish different materials on a surface. Wear tests on a single-crystal silicon <100> surface show different friction coefficient regimes, depending on the applied load. For small loads, there is no wear and the friction coefficient is constant. For larger loads, the friction coefficient and wear depth increase with normal load.

Smart Piezoelectric PZT Microcantilevers with Inherent Sensing and Actuating Abilities for AFM and LFM

1996 ◽  
Vol 459 ◽  
Author(s):  
C. Lee ◽  
T. Itoh ◽  
J. Chu ◽  
T. Ohashi ◽  
R. Maeda ◽  
...  
Keyword(s):  
Sample Surface ◽  
Lateral Force ◽  
Smart Structure ◽  
Thin Layers ◽  
Force Sensing ◽  
Free Standing ◽  
Atomic Force ◽  
Lateral Force Microscope ◽  
Dynamic Scanning ◽  
Piezoelectric Charge

ABSTRACTNovel designs of the force sensing components for an atomic force microscope (AFM) and lateral force microscope (LFM) have been proposed in this study. By using PZT thin layers, a smart structure that can perform force sensing and feedback actuation at the same time is applied to the AFM. Clear images can be derived by an AFM equipped with this smart structure. A structure of two parallel PZT bars integrated on a SiO2 free standing cantilever has shown potential for operation in an LFM, because a difference in the piezoelectric charge outputs from these two beams will be induced by frictional force when the cantilever end quasi-staticly contacts with the sample surface in dynamic scanning across the surface.

scholarly journals Imaging Chromosome by a Lateral Force Microscope.

2000 ◽  
Vol 16 (12) ◽  
pp. 1261-1264 ◽  
Author(s):  
Hongda WANG ◽  
Yingchun SUN ◽  
Zhuang LI ◽  
Erkang WANG ◽  
Baiqu HUANG
Keyword(s):  
Lateral Force ◽  
Lateral Force Microscope

Ultrasonic Force Microscopic Characterization of Nanosized Copper Particles

1999 ◽  
Vol 581 ◽  
Author(s):  
E. J. Schumaker ◽  
L. Shen ◽  
M. J. Ruddell ◽  
S. Sathish ◽  
P. T. Murray
Keyword(s):  
Quartz Substrate ◽  
Lateral Force ◽  
Force Microscopy ◽  
Atomic Force ◽  
Probe Microscope ◽  
Property Measurement ◽  
Cluster Beam Deposition ◽  
Lateral Force Microscope ◽  
Beam Deposition

ABSTRACTAn Ultrasonic Force Microscope capable of imaging elastic modulus variations with nanometer resolution has been developed by modifying a Scanning Probe Microscope. Images of ultrasonic properties have been simultaneously obtained with the topography images. The technique has been utilized to characterize nanoscale copper droplets and grains deposited on a quartz substrate by ionized cluster beam deposition. Images of the same region obtained with atomic force microscope, lateral force microscope, and ultrasonic force microscope are compared. The origin of image contrast in ultrasonic force microscopy and its utilization for quantitative elastic property measurement of nanometer particles are discussed.

System modelling of a lateral force microscope

2008 ◽  
Vol 19 (45) ◽  
pp. 455707 ◽  
Author(s):  
Guillaume Michal ◽  
Cheng Lu ◽  
A Kiet Tieu
Keyword(s):  
Lateral Force ◽  
System Modelling ◽  
Lateral Force Microscope

Quantitative comparison of three calibration techniques for the lateral force microscope

2001 ◽  
Vol 72 (8) ◽  
pp. 3304-3312 ◽  
Author(s):  
Robert G. Cain ◽  
Mark G. Reitsma ◽  
Simon Biggs ◽  
Neil W. Page
Keyword(s):  
Lateral Force ◽  
Quantitative Comparison ◽  
Calibration Techniques ◽  
Lateral Force Microscope

Calibration procedures for frictional measurements with a lateral force microscope

Wear ◽  
1996 ◽  
Vol 192 (1-2) ◽  
pp. 141-150 ◽  
Author(s):  
E. Liu ◽  
B. Blanpain ◽  
J.P. Celis
Keyword(s):  
Lateral Force ◽  
Lateral Force Microscope
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