scholarly journals Discussion: “Simultaneous Measurement of Surface Topography and Friction Force by a Single-Head Lateral Force Microscope” (Lu, C.-J., Jiang, Zhaoguo, Bogy, D. B., and Miyamoto, T., 1995, ASME J. Tribol., 117, pp. 334–340)

1995 ◽  
Vol 117 (2) ◽  
pp. 340-340
Author(s):  
Bharat Bhushan
Keyword(s):  
Surface Topography ◽  
Friction Force ◽  
Simultaneous Measurement ◽  
Lateral Force ◽  
Lateral Force Microscope

Simultaneous Measurement of Surface Topography and Friction Force by a Single-Head Lateral Force Microscope

1995 ◽  
Vol 117 (2) ◽  
pp. 334-340 ◽  
Author(s):  
C.-J. Lu ◽  
Zhaoguo Jiang ◽  
D. B. Bogy ◽  
T. Miyamoto
Keyword(s):  
Friction Coefficient ◽  
Surface Topography ◽  
Friction Force ◽  
Rotation Angle ◽  
Point Contact ◽  
Lateral Force ◽  
Wear Depth ◽  
Optical Head ◽  
Lateral Force Microscope ◽  
Normal Deflection

Although friction force measurements using one sensor to detect both the normal deflection and rotation angle of a scanning probe are convenient and popular, the critical issues regarding the calibration of the instruments have not been fully studied. A Lateral Force Microscope (LFM), modified from the Point Contact Microscope (PCM), is used to simultaneously measure the surface topography and friction force. An optical head is used to measure the normal bending deflection and rotation angle of the cantilever that carries the diamond tip. Emphasis is put on the development of reliable calibration procedures for obtaining the normal deflection and rotation sensitivities of the optical head as well as the spring constants in the bending and torsion modes. The friction loop, which is essential for friction measurements, is investigated in detail. The LFM is used to measure a two-phase composite to show its ability to distinguish different materials on a surface. Wear tests on a single-crystal silicon <100> surface show different friction coefficient regimes, depending on the applied load. For small loads, there is no wear and the friction coefficient is constant. For larger loads, the friction coefficient and wear depth increase with normal load.

scholarly journals Contributions of lunate cells and wax crystals to the surface anisotropy of Nepenthes slippery zone

2018 ◽  
Vol 5 (9) ◽  
pp. 180766 ◽  
Author(s):  
Lixin Wang ◽  
Dashuai Tao ◽  
Shiyun Dong ◽  
Shanshan Li ◽  
Yu Tian
Keyword(s):  
Atomic Force Microscope ◽  
Surface Topography ◽  
Friction Force ◽  
Body Length ◽  
Structural Features ◽  
Large Displacements ◽  
Surface Anisotropy ◽  
Atomic Force ◽  
Microstructure Examination ◽  
Wax Crystals

Nepenthes slippery zone presents surface anisotropy depending on its specialized structures. Herein, via macro–micro–nano scaled experiments, we analysed the contributions of lunate cells and wax crystals to this anisotropy. Macroscopic climbing of insects showed large displacements (triple body length within 3 s) and high velocities (6.16–20.47 mm s −1 ) in the inverted-fixed (towards digestive zone) slippery zone, but failed to climb forward in the normal-fixed (towards peristome) one. Friction force of insect claws sliding across inverted-fixed lunate cells was about 2.4 times of that sliding across the normal-fixed ones, whereas showed unobvious differences (1.06–1.11 times) between the inverted- and normal-fixed wax crystals. Innovative results from atomic force microscope scanning and microstructure examination demonstrated the upper layer of wax crystals causes the cantilever tip to generate rather small differences in friction data (1.92–2.72%), and the beneath layer provides slightly higher differences (4.96–7.91%). The study confirms the anisotropic configuration of lunate cells produces most of the anisotropy, whereas both surface topography and structural features of the wax crystals generate a slight contribution. These results are helpful for understanding the surface anisotropy of Nepenthes slippery zone, and guide the design of bioinspired surface with anisotropic properties.

CONSISTENCY ANALYSIS OF WORN SURFACE TOPOGRAPHY AND FRICTION FORCE BASED ON PHASE TRAJECTORY AND RECURRENCE ANALYSIS

Fractals ◽  
2019 ◽  
Vol 27 (08) ◽  
pp. 1950130
Author(s):  
XUE ZUO ◽  
MINGLONG PENG ◽  
YUANKAI ZHOU
Keyword(s):  
Fractal Dimension ◽  
Surface Topography ◽  
Friction Force ◽  
Phase Trajectory ◽  
Small Volume ◽  
Surface Profile ◽  
Recurrence Plots ◽  
Recurrence Analysis ◽  
Wear Process ◽  
Worn Surface

The dynamic evolutions of friction force and worn surface profile were qualitatively analyzed by phase trajectory and recurrence plots and quantitatively characterized by fractal dimension and percent determinism. The results show that phase trajectories first shrink to a small volume, then stabilize at a minimum volume, finally expand to a large volume in the wear process. The white areas on the recurrence plots increase with the wear time. The fractal dimension first increases, then stabilizes at a high value, and finally decreases rapidly. The percent determinism first decreases, then fluctuates in a certain range, and finally increases. It demonstrates that friction force and worn surface topography derived from one tribology system evolve in a similar but not exactly the same way. They have the consistent evolution law in the wear process. Specially, friction force is much more sensitive to the variation of wear states than the worn surface.

Quantification of Friction Force for Dual-Axis Probe Friction Force Microscope

2009 ◽  
Author(s):  
Hiroaki Amakawa ◽  
Kenji Fukuzawa ◽  
Mitsuhiro Shikida ◽  
Hedong Zhang ◽  
Shitaro Itoh
Keyword(s):  
Friction Force ◽  
Normal Force ◽  
Calibration Method ◽  
Lateral Force ◽  
Vertical Force ◽  
Torsion Beam ◽  
Force Sensitivity ◽  
Mechanical Interference ◽  
Friction Force Microscope ◽  
Mechanical Probe

Conventional friction force microscopes (FFMs) had the disadvantage of low force sensitivity due to mechanical interference between torsion caused by friction force and deflection by normal force. In order to overcome disadvantage, we developed a dual-axis micro-mechanical probe, which measures the lateral force by the double cantilever and the vertical force by the torsion beam. However, the calibration method of the lateral force has not been established. In this study, we present a new calibration method using a step-structure.

Smart Piezoelectric PZT Microcantilevers with Inherent Sensing and Actuating Abilities for AFM and LFM

1996 ◽  
Vol 459 ◽  
Author(s):  
C. Lee ◽  
T. Itoh ◽  
J. Chu ◽  
T. Ohashi ◽  
R. Maeda ◽  
...  
Keyword(s):  
Sample Surface ◽  
Lateral Force ◽  
Smart Structure ◽  
Thin Layers ◽  
Force Sensing ◽  
Free Standing ◽  
Atomic Force ◽  
Lateral Force Microscope ◽  
Dynamic Scanning ◽  
Piezoelectric Charge

ABSTRACTNovel designs of the force sensing components for an atomic force microscope (AFM) and lateral force microscope (LFM) have been proposed in this study. By using PZT thin layers, a smart structure that can perform force sensing and feedback actuation at the same time is applied to the AFM. Clear images can be derived by an AFM equipped with this smart structure. A structure of two parallel PZT bars integrated on a SiO2 free standing cantilever has shown potential for operation in an LFM, because a difference in the piezoelectric charge outputs from these two beams will be induced by frictional force when the cantilever end quasi-staticly contacts with the sample surface in dynamic scanning across the surface.

A Comparison of Lateral Calibration Techniques for Quantitative Friction Force Microscopy

2005 ◽  
Author(s):  
K. S. Kanaga Karuppiah ◽  
Sriram Sundararajan
Keyword(s):  
Friction Force ◽  
Lateral Force ◽  
Silicon Sample ◽  
Friction Force Microscopy ◽  
Friction Behavior ◽  
Force Microscopy ◽  
Atomic Force ◽  
Force Calibration ◽  
Calibration Techniques ◽  
Ultra High Molecular Weight

A comparison of two lateral force calibration techniques for friction force microscopy is presented. We used methods developed by Ogletree et.al. [1] and Ruan and Bhushan [2] to measure the friction response between the atomic force microscope (AFM) probe and a silicon sample and to obtain lateral force calibration factors. The factors were used to characterize the friction behavior and interfacial shear strength of a silicon nitride (Si3N4) probe-ultra high molecular weight polyethylene (UHMWPE) interface.

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