Quantitative characterization of friction coefficient using lateral force microscope in the wearless regime

2004 ◽  
Vol 75 (2) ◽  
pp. 415-421 ◽  
Author(s):  
P. Bilas ◽  
L. Romana ◽  
B. Kraus ◽  
Y. Bercion ◽  
J. L. Mansot
Keyword(s):  
Friction Coefficient ◽  
Lateral Force ◽  
Quantitative Characterization ◽  
Lateral Force Microscope

Simultaneous Measurement of Surface Topography and Friction Force by a Single-Head Lateral Force Microscope

1995 ◽  
Vol 117 (2) ◽  
pp. 334-340 ◽  
Author(s):  
C.-J. Lu ◽  
Zhaoguo Jiang ◽  
D. B. Bogy ◽  
T. Miyamoto
Keyword(s):  
Friction Coefficient ◽  
Surface Topography ◽  
Friction Force ◽  
Rotation Angle ◽  
Point Contact ◽  
Lateral Force ◽  
Wear Depth ◽  
Optical Head ◽  
Lateral Force Microscope ◽  
Normal Deflection

Although friction force measurements using one sensor to detect both the normal deflection and rotation angle of a scanning probe are convenient and popular, the critical issues regarding the calibration of the instruments have not been fully studied. A Lateral Force Microscope (LFM), modified from the Point Contact Microscope (PCM), is used to simultaneously measure the surface topography and friction force. An optical head is used to measure the normal bending deflection and rotation angle of the cantilever that carries the diamond tip. Emphasis is put on the development of reliable calibration procedures for obtaining the normal deflection and rotation sensitivities of the optical head as well as the spring constants in the bending and torsion modes. The friction loop, which is essential for friction measurements, is investigated in detail. The LFM is used to measure a two-phase composite to show its ability to distinguish different materials on a surface. Wear tests on a single-crystal silicon <100> surface show different friction coefficient regimes, depending on the applied load. For small loads, there is no wear and the friction coefficient is constant. For larger loads, the friction coefficient and wear depth increase with normal load.

Ultrasonic Force Microscopic Characterization of Nanosized Copper Particles

1999 ◽  
Vol 581 ◽  
Author(s):  
E. J. Schumaker ◽  
L. Shen ◽  
M. J. Ruddell ◽  
S. Sathish ◽  
P. T. Murray
Keyword(s):  
Quartz Substrate ◽  
Lateral Force ◽  
Force Microscopy ◽  
Atomic Force ◽  
Probe Microscope ◽  
Property Measurement ◽  
Cluster Beam Deposition ◽  
Lateral Force Microscope ◽  
Beam Deposition

ABSTRACTAn Ultrasonic Force Microscope capable of imaging elastic modulus variations with nanometer resolution has been developed by modifying a Scanning Probe Microscope. Images of ultrasonic properties have been simultaneously obtained with the topography images. The technique has been utilized to characterize nanoscale copper droplets and grains deposited on a quartz substrate by ionized cluster beam deposition. Images of the same region obtained with atomic force microscope, lateral force microscope, and ultrasonic force microscope are compared. The origin of image contrast in ultrasonic force microscopy and its utilization for quantitative elastic property measurement of nanometer particles are discussed.

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