The effect of surface roughness scattering on hole mobility in double gate silicon-on-insulator devices

2009 ◽  
Vol 106 (2) ◽  
pp. 023705 ◽  
Author(s):  
Luca Donetti ◽  
Francisco Gámiz ◽  
Noel Rodriguez ◽  
Andres Godoy ◽  
Carlos Sampedro
Keyword(s):  
Surface Roughness ◽  
Hole Mobility ◽  
Silicon On Insulator ◽  
Double Gate ◽  
Surface Roughness Scattering ◽  
Effect Of Surface

Role of surface-roughness scattering in double gate silicon-on-insulator inversion layers

2001 ◽  
Vol 89 (3) ◽  
pp. 1764 ◽  
Author(s):  
F. Gámiz ◽  
J. B. Roldán ◽  
P. Cartujo-Cassinello ◽  
J. A. López-Villanueva ◽  
P. Cartujo
Keyword(s):  
Surface Roughness ◽  
Silicon On Insulator ◽  
Double Gate ◽  
Surface Roughness Scattering

scholarly journals Remote surface roughness scattering in fully depleted silicon-on-insulator devices with high-κ/SiO2 gate stacks

2015 ◽  
Vol 106 (2) ◽  
pp. 023508 ◽  
Author(s):  
Y. M. Niquet ◽  
I. Duchemin ◽  
V.-H. Nguyen ◽  
F. Triozon ◽  
D. Rideau
Keyword(s):  
Surface Roughness ◽  
Silicon On Insulator ◽  
Gate Stacks ◽  
Fully Depleted ◽  
Surface Roughness Scattering

Hole Mobility Characteristics with Surface Roughness on Silicon-on-Insulator Substrate

2018 ◽  
Vol 18 (9) ◽  
pp. 6017-6020
Author(s):  
Hyeseon Shin ◽  
Il-Ki Han ◽  
Jae-Hyeon Ko ◽  
Moongyu Jang
Keyword(s):  
Surface Roughness ◽  
Hole Mobility ◽  
Silicon On Insulator ◽  
Insulator Substrate
Sign in / Sign up

Export Citation Format

Share Document