Role of surface-roughness scattering in double gate silicon-on-insulator inversion layers
Keyword(s):
Keyword(s):
2001 ◽
Vol 89
(10)
◽
pp. 5478-5487
◽
Keyword(s):
2010 ◽
Vol 57
(9)
◽
pp. 2057-2066
◽
2017 ◽
Vol 61
(2)
◽
pp. 295-303
◽