Ellipsometric in situ measurement of oxidation kinetics and thickness of (C2–C20) alkylsilyl (sub)monolayers
1987 ◽
Vol 22
(10)
◽
pp. 3595-3601
◽
2009 ◽
2002 ◽
Vol 33
(4)
◽
pp. 1051-1056
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