Mapping the electrostatic potential across AlGaN∕AlN∕GaN heterostructures using electron holography

2007 ◽  
Vol 90 (3) ◽  
pp. 032101 ◽  
Author(s):  
Z. H. Wu ◽  
M. Stevens ◽  
F. A. Ponce ◽  
W. Lee ◽  
J. H. Ryou ◽  
...  
Keyword(s):  
Electrostatic Potential ◽  
Electron Holography

scholarly journals Three-dimensional reconstructions of electrostatic potential distributions with 1.5-nm resolution using off-axis electron holography

Microscopy ◽  
2011 ◽  
Vol 61 (2) ◽  
pp. 77-84 ◽  
Author(s):  
Toshiaki Tanigaki ◽  
Shinji Aizawa ◽  
Takahiro Suzuki ◽  
Akira Tonomura
Keyword(s):  
Electrostatic Potential ◽  
Three Dimensional ◽  
Electron Holography

Split-illumination electron holography for improved evaluation of electrostatic potential associated with electrophotography

2014 ◽  
Vol 104 (13) ◽  
pp. 131601 ◽  
Author(s):  
Toshiaki Tanigaki ◽  
Kuniaki Sato ◽  
Zentaro Akase ◽  
Shinji Aizawa ◽  
Hyun Soon Park ◽  
...  
Keyword(s):  
Electrostatic Potential ◽  
Electron Holography

scholarly journals Electrostatic-Potential Analysis of Charged Particles by Split-Illumination Electron Holography

2015 ◽  
Vol 21 (S3) ◽  
pp. 1969-1970
Author(s):  
Toshiaki Tanigaki ◽  
Zentaro Akase ◽  
Shinji Aizawa ◽  
Hyun Soon Park ◽  
Yasukazu Murakami ◽  
...  
Keyword(s):  
Electrostatic Potential ◽  
Charged Particles ◽  
Electron Holography ◽  
Potential Analysis

Electrostatic potential in manganite-based heterojunctions by electron holography

2005 ◽  
Vol 87 (16) ◽  
pp. 164102 ◽  
Author(s):  
H. F. Tian ◽  
J. R. Sun ◽  
H. B. Lü ◽  
K. J. Jin ◽  
H. X. Yang ◽  
...  
Keyword(s):  
Electrostatic Potential ◽  
Electron Holography

Wedge-shaped and flat cross-sections for quantitative characterization of the electrostatic potential distributions across p-n junctions by electron holography

2005 ◽  
Vol 37 (2) ◽  
pp. 221-224 ◽  
Author(s):  
Zhouguang Wang ◽  
Takeharu Kato ◽  
Tsukasa Hirayama ◽  
Naoko Kato ◽  
Katsuhiro Sasaki ◽  
...  
Keyword(s):  
Cross Sections ◽  
Electrostatic Potential ◽  
Electron Holography ◽  
Quantitative Characterization

In-situ TEM observation of electromagnetic field in some real materials

2005 ◽  
Vol 907 ◽  
Author(s):  
Katsuhiro Sasaki ◽  
Zhouguang Wang ◽  
Keiichi Fukunaga ◽  
Tsukasa Hirayama ◽  
Kotaro Kuroda ◽  
...  
Keyword(s):  
Electromagnetic Field ◽  
Electrostatic Potential ◽  
Ceramic Particle ◽  
Single Step ◽  
Electron Holography ◽  
In Situ Tem ◽  
Cross Sectional ◽  
Simple Method ◽  
Silicon Device

AbstractElectromagnetic fields presents in some real materials have been observed using electron holography and a simple method named the Shadow Image Distortion (SID) method which we have developed. The in-situ electron holography observation of the electric field surrounding a ceramic particle showed the rapid degradation of dielectric properties of the particle at an elevated temperature. The cross sectional view of mean electrostatic potential distributions in a silicon device has been observed. In-situ electron holography and SID observations showed the electrostatic potential distribution across a reverse biased p-n junction in a compound semiconductor. The SID method using a dedicated tool allowed single-step imaging of 2D maps of electromagnetic field.

scholarly journals Three-dimensional electrostatic potential of a Sip-njunction revealed using tomographic electron holography

2006 ◽  
Vol 26 ◽  
pp. 29-32 ◽  
Author(s):  
A C Twitchett ◽  
T J V Yates ◽  
R E Dunin-Borkowski ◽  
S B Newcomb ◽  
P A Midgley
Keyword(s):  
Electrostatic Potential ◽  
Three Dimensional ◽  
Electron Holography

Potential and Limitations of Electron Holography in Silicon Research

2005 ◽  
Vol 108-109 ◽  
pp. 603-608 ◽  
Author(s):  
Peter Formanek ◽  
Martin Kittler
Keyword(s):  
Phase Shift ◽  
Electrostatic Potential ◽  
Bipolar Transistors ◽  
Electron Holography ◽  
Local Phase ◽  
Electron Wave ◽  
Promising Candidate ◽  
Silicon Technology

We report on electron holography as a promising candidate for diagnostics in silicon technology and research. Electron holography determines the local phase shift of the electron wave passing through a sample. The phase is proportional to the 2D projected electrostatic potential in the sample and thus reveals p-n junctions and, indirectly, doping. We demonstrate detection of submonolayer boron layers in Si and SiGe, measurement of Ge concentration in SiGe and qualitative 2D oxygen mapping in SiO2/Si structures with 0.5 nm resolution, and comparison of doping in two bipolar transistors with different base implant. Resolution and noise limits are discussed.

Probing the electrostatic potential of charged dislocations inn−GaNandn−ZnOepilayers by transmission electron holography

2006 ◽  
Vol 73 (24) ◽  
Author(s):  
E. Müller ◽  
D. Gerthsen ◽  
P. Brückner ◽  
F. Scholz ◽  
Th. Gruber ◽  
...  
Keyword(s):  
Electrostatic Potential ◽  
Electron Holography ◽  
Transmission Electron
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