Down to 2 nm Ultra Shallow Junctions : Fabrication by IBS Plasma Immersion Ion Implantation Prototype PULSION®

Author(s):  
Frank Torregrosa ◽  
Hasnaa Etienne ◽  
Gilles Mathieu ◽  
Laurent Roux
2009 ◽  
Vol 255 (10) ◽  
pp. 5647-5650 ◽  
Author(s):  
Vanessa Vervisch ◽  
Yannick Larmande ◽  
Philippe Delaporte ◽  
Thierry Sarnet ◽  
Marc Sentis ◽  
...  

2014 ◽  
Vol 32 (6) ◽  
pp. 061302 ◽  
Author(s):  
Ashok Ray ◽  
Rajashree Nori ◽  
Piyush Bhatt ◽  
Saurabh Lodha ◽  
Richard Pinto ◽  
...  

1999 ◽  
Vol 138-139 ◽  
pp. 224-227 ◽  
Author(s):  
I Pintér ◽  
A.H Abdulhadi ◽  
Zs Makaró ◽  
N.Q Khanh ◽  
M Ádám ◽  
...  

2013 ◽  
Vol 854 ◽  
pp. 141-145
Author(s):  
V.G. Litovchenko ◽  
B. Romanyuk ◽  
O. Oberemok ◽  
V. Popov ◽  
V. Melnik ◽  
...  

Ultra-shallow junctions (USJs) were formed by low-energy As ion implantation with the subsequent furnace annealing. It was found that the significant amount of oxygen is redistributed from the silicon bulk to the arsenic-implanted region. We present the effect of oxygen gettering at the creation of arsenic-doped USJs using the marker layer created by ion implantation of 18O isotope.


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