Channel electron multiplier and channelplate efficiencies for detecting positive ions

2005 ◽  
Vol 76 (9) ◽  
pp. 093305 ◽  
Author(s):  
M. Krems ◽  
J. Zirbel ◽  
M. Thomason ◽  
R. D. DuBois
Keyword(s):  
Channel Electron Multiplier ◽  
Electron Multiplier ◽  
Positive Ions

scholarly journals In situ absolute calibration of a channel electron multiplier for detection of positive ions

1995 ◽  
Vol 66 (1) ◽  
pp. 67-71 ◽  
Author(s):  
D. W. Savin ◽  
L. D. Gardner ◽  
D. B. Reisenfeld ◽  
A. R. Young ◽  
J. L. Kohl
Keyword(s):  
Absolute Calibration ◽  
Channel Electron Multiplier ◽  
Electron Multiplier ◽  
Positive Ions

Detection Efficiency of a Continuous Channel Electron Multiplier for Positive Ions

1967 ◽  
Vol 38 (10) ◽  
pp. 1477-1481 ◽  
Author(s):  
Clifford N. Burrous ◽  
Albert J. Lieber ◽  
Vladimir T. Zaviantseff
Keyword(s):  
Detection Efficiency ◽  
Channel Electron Multiplier ◽  
Electron Multiplier ◽  
Positive Ions

First H+ Charge-Exchange Images in the Stim.

1976 ◽  
Vol 34 ◽  
pp. 504-505
Author(s):  
Wm. H. Escovitz ◽  
T. R. Fox ◽  
R. Levi-Setti
Keyword(s):  
Charge Exchange ◽  
Neutral Component ◽  
Channel Electron Multiplier ◽  
Electron Multiplier ◽  
Neutral Particles ◽  
Charged Beam ◽  
Scanning Transmission ◽  
Contrast Mechanism ◽  
Ion Microscopy ◽  
Beam Component

Charge exchange, the neutralization of ions by electron capture as the ions traverse matter, is a well-known phenomenon of atomic physics which is relevant to ion microscopy. In conventional transmission ion microscopes, the neutral component of the beam after it emerges from the specimen cannot be focused. The scanning transmission ion microscope (STIM) enables the detection of this signal to make images. Experiments with a low-resolution 55 kV STIM indicate that the charge-exchange signal provides a new contrast mechanism to detect extremely small amounts of matter. In an early version of charge-exchange detection (fig. 1), a permanent magnet installed between the specimen and the detector (a channel electron multiplier) sweeps the charged beam component away from the detector and allows only the neutrals to reach it. When the magnet is removed, both charged and neutral particles reach the detector.

The Channel Electron Multiplier as an Alpha Detector

1968 ◽  
Vol 15 (1) ◽  
pp. 498-502 ◽  
Author(s):  
W. C. Kaiser ◽  
W. W. Managan ◽  
T. A. Mayer
Keyword(s):  
Channel Electron Multiplier ◽  
Electron Multiplier

A test apparatus for secondary ion mass spectrometry

1983 ◽  
Vol 61 (4) ◽  
pp. 535-542 ◽  
Author(s):  
N. Klaus ◽  
J. D. Brown
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Low Cost ◽  
Ion Source ◽  
Channel Electron Multiplier ◽  
Electron Multiplier ◽  
Spherical Source ◽  
Ion Mass Spectrometry ◽  
Cylindrical Source ◽  
Secondary Ion

A low cost test device for secondary ion mass spectrometry (SIMS) components is described. It consists of a turbomolecular pumped vessel containing an insulated sample stage on an x−y manipulator, extraction optics, quadrupole mass filter, and channel electron multiplier. The construction and characteristics of a cylindrical and a spherical saddlefield ion source are described. The output of the cylindrical source is 10−4 A cm−2 whereas that of the spherical source is in the order of 10−3 A cm−2 at voltages up to 9 kV and at a beam divergence of 4°.

Characteristics of an Electron Multiplier in the Detection of Positive Ions

1954 ◽  
Vol 25 (11) ◽  
pp. 1112-1115 ◽  
Author(s):  
C. F. Barnett ◽  
G. E. Evans ◽  
P. M. Stier
Keyword(s):  
Electron Multiplier ◽  
Positive Ions

scholarly journals Comparative Response of Microchannel Plate and Channel Electron Multiplier Detectors to Penetrating Radiation in Space

2015 ◽  
Vol 62 (5) ◽  
pp. 2283-2293 ◽  
Author(s):  
Herbert O. Funsten ◽  
Ronnie W. Harper ◽  
Eric E. Dors ◽  
Paul A. Janzen ◽  
Brian A. Larsen ◽  
...  
Keyword(s):  
Microchannel Plate ◽  
Channel Electron Multiplier ◽  
Electron Multiplier ◽  
Comparative Response
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