Detection Efficiency of a Continuous Channel Electron Multiplier for Positive Ions

1967 ◽  
Vol 38 (10) ◽  
pp. 1477-1481 ◽  
Author(s):  
Clifford N. Burrous ◽  
Albert J. Lieber ◽  
Vladimir T. Zaviantseff
Keyword(s):  
Detection Efficiency ◽  
Channel Electron Multiplier ◽  
Electron Multiplier ◽  
Positive Ions

scholarly journals In situ absolute calibration of a channel electron multiplier for detection of positive ions

1995 ◽  
Vol 66 (1) ◽  
pp. 67-71 ◽  
Author(s):  
D. W. Savin ◽  
L. D. Gardner ◽  
D. B. Reisenfeld ◽  
A. R. Young ◽  
J. L. Kohl
Keyword(s):  
Absolute Calibration ◽  
Channel Electron Multiplier ◽  
Electron Multiplier ◽  
Positive Ions

Channel electron multiplier and channelplate efficiencies for detecting positive ions

2005 ◽  
Vol 76 (9) ◽  
pp. 093305 ◽  
Author(s):  
M. Krems ◽  
J. Zirbel ◽  
M. Thomason ◽  
R. D. DuBois
Keyword(s):  
Channel Electron Multiplier ◽  
Electron Multiplier ◽  
Positive Ions

First H+ Charge-Exchange Images in the Stim.

1976 ◽  
Vol 34 ◽  
pp. 504-505
Author(s):  
Wm. H. Escovitz ◽  
T. R. Fox ◽  
R. Levi-Setti
Keyword(s):  
Charge Exchange ◽  
Neutral Component ◽  
Channel Electron Multiplier ◽  
Electron Multiplier ◽  
Neutral Particles ◽  
Charged Beam ◽  
Scanning Transmission ◽  
Contrast Mechanism ◽  
Ion Microscopy ◽  
Beam Component

Charge exchange, the neutralization of ions by electron capture as the ions traverse matter, is a well-known phenomenon of atomic physics which is relevant to ion microscopy. In conventional transmission ion microscopes, the neutral component of the beam after it emerges from the specimen cannot be focused. The scanning transmission ion microscope (STIM) enables the detection of this signal to make images. Experiments with a low-resolution 55 kV STIM indicate that the charge-exchange signal provides a new contrast mechanism to detect extremely small amounts of matter. In an early version of charge-exchange detection (fig. 1), a permanent magnet installed between the specimen and the detector (a channel electron multiplier) sweeps the charged beam component away from the detector and allows only the neutrals to reach it. When the magnet is removed, both charged and neutral particles reach the detector.

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