The charge trapping effect of metal-ferroelectric (PbZr0.53Ti0.47O3)-insulator (HfO2)-silicon capacitors

2005 ◽  
Vol 98 (4) ◽  
pp. 044103 ◽  
Author(s):  
Pi-chun Juan ◽  
Yu-ping Hu ◽  
Fu-chien Chiu ◽  
Joseph Ya-min Lee
Keyword(s):  
Charge Trapping ◽  
Trapping Effect

A comparative study of charge trapping effect in p-type MoTe2 and WSe2 FETs using pulsed current–voltage measurements

2021 ◽  
Vol 60 (1) ◽  
pp. 011003
Author(s):  
Jeong Yong Yang ◽  
Chan Ho Lee ◽  
Young Taek Oh ◽  
Jiyeon Ma ◽  
Junseok Heo ◽  
...  
Keyword(s):  
Comparative Study ◽  
Charge Trapping ◽  
Pulsed Current ◽  
Trapping Effect ◽  
Current Voltage ◽  
P Type

Investigating the degradation behavior caused by charge trapping effect under DC and AC gate-bias stress for InGaZnO thin film transistor

2011 ◽  
Vol 99 (2) ◽  
pp. 022104 ◽  
Author(s):  
Te-Chih Chen ◽  
Ting-Chang Chang ◽  
Tien-Yu Hsieh ◽  
Wei-Siang Lu ◽  
Fu-Yen Jian ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistor ◽  
Charge Trapping ◽  
Gate Bias ◽  
Degradation Behavior ◽  
Bias Stress ◽  
Trapping Effect ◽  
Gate Bias Stress

Logic Control of Interface-Induced Charge-Trapping Effect for Ultrasensitive Gas Detection with All-Mirror-Image Symmetry

2016 ◽  
Vol 1 (3) ◽  
pp. 1600067 ◽  
Author(s):  
Chuancheng Jia ◽  
Qing Wang ◽  
Na Xin ◽  
Jian Zhou ◽  
Yao Gong ◽  
...  
Keyword(s):  
Charge Trapping ◽  
Mirror Image ◽  
Gas Detection ◽  
Logic Control ◽  
Trapping Effect ◽  
Induced Charge

Metastable charge-trapping effect in SOI nMOSTs at 4.2 K

1993 ◽  
Vol 8 (3) ◽  
pp. 423-428 ◽  
Author(s):  
E Simoen ◽  
M -H Gao ◽  
J -P Colinge ◽  
C Claeys
Keyword(s):  
Charge Trapping ◽  
Trapping Effect
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