Efficient field emission from α-Fe2O3 nanoflakes on an atomic force microscope tip

2005 ◽  
Vol 87 (2) ◽  
pp. 023103 ◽  
Author(s):  
Y. W. Zhu ◽  
T. Yu ◽  
C. H. Sow ◽  
Y. J. Liu ◽  
A. T. S. Wee ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Field Emission ◽  
Atomic Force

High-resolution atomic force microscope nanotip grown by self-field emission

2002 ◽  
Vol 81 (16) ◽  
pp. 3037-3039 ◽  
Author(s):  
C. H. Oon ◽  
J. T. L. Thong ◽  
Y. Lei ◽  
W. K. Chim
Keyword(s):  
High Resolution ◽  
Atomic Force Microscope ◽  
Field Emission ◽  
Atomic Force

scholarly journals A local field emission study of partially aligned carbon-nanotubes by atomic force microscope probe

Carbon ◽  
2007 ◽  
Vol 45 (15) ◽  
pp. 2957-2971 ◽  
Author(s):  
A. Di Bartolomeo ◽  
A. Scarfato ◽  
F. Giubileo ◽  
F. Bobba ◽  
M. Biasiucci ◽  
...  
Keyword(s):  
Carbon Nanotubes ◽  
Atomic Force Microscope ◽  
Field Emission ◽  
Local Field ◽  
Atomic Force Microscope Probe ◽  
Atomic Force ◽  
Aligned Carbon Nanotubes ◽  
Emission Study ◽  
Microscope Probe

Atomic Force Microscope Deposition Assisted by Electric Field

2013 ◽  
Vol 677 ◽  
pp. 69-73
Author(s):  
Zeng Lei Liu ◽  
Nian Dong Jiao ◽  
Zhi Dong Wang ◽  
Zai Li Dong ◽  
Lian Qing Liu
Keyword(s):  
Electrical Properties ◽  
Electric Field ◽  
Atomic Force Microscope ◽  
Field Emission ◽  
Theoretical Explanation ◽  
Research Field ◽  
Deposition Method ◽  
Practical Applications ◽  
Atomic Force

This paper introduces atomic force microscope (AFM) deposition method to fabricate nanostructures and nanodevices. Field emission theory is introduced in this paper, which provides theoretical explanation for AFM deposition. Dot matrixes are fabricated by AFM deposition on three different substrates, Si, Au and GaAs. Differences of deposition on the three substrates are discussed. AFM deposition has many practical applications. For example, AFM deposition can be used to solder nano components together to improve electrical properties of nanodevices. Besides nanosoldering, AFM deposition can also be used in fabrication of nanodevices. Thus AFM deposition is a valuable research field for future massive applications of nanodevices.

scholarly journals Investigations on Long-Range AFM Scans Using a Nanofabrication Machine (NFM-100)

Proceedings ◽  
2020 ◽  
Vol 56 (1) ◽  
pp. 34
Author(s):  
Jaqueline Stauffenberg ◽  
Ingo Ortlepp ◽  
Christoph Reuter ◽  
Mathias Holz ◽  
Denis Dontsov ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Long Range ◽  
Field Emission ◽  
Scanning Probe ◽  
Measuring System ◽  
Scanning Probe Lithography ◽  
Nano Fabrication ◽  
Atomic Force

The focus of this work lies on investigations on a new Nano Fabrication Machine (NFM-100) with a mounted atomic force microscope (AFM). This installed tip-based measuring system uses self-sensing and self-actuated microcantilevers, which can be used especially for field-emission scanning probe lithography (FESPL). The NFM-100 has a positioning range of Ø 100 mm, which offers, in combination with the tip-based measuring system, the possibility to analyse structures over long ranges. Using different gratings, the accuracy and the reproducibility of the NFM-100 and the AFM-system will be shown.

Characteristics Analysis for Nanosoldering with Atomic Force Microscope

NANO ◽  
2018 ◽  
Vol 13 (04) ◽  
pp. 1850040
Author(s):  
Zenglei Liu ◽  
Ailian Gao ◽  
Shuangxi Xie ◽  
Niandong Jiao ◽  
Lianqing Liu
Keyword(s):  
Atomic Force Microscope ◽  
Field Emission ◽  
Field Effect ◽  
Field Effect Transistor ◽  
Mechanical Characteristics ◽  
Atomic Force ◽  
Characteristics Analysis ◽  
Potential Applications ◽  
Effect Transistor ◽  
Afm Probe

Field-emission deposition of atomic force microscope (AFM) can be used to fabricate nanopads, and therefore has potential applications in soldering nanodevices. However, the soldering effects are hard to verify because the soldering pads are of nanoscale. This paper studied the electrical, thermal and mechanical characteristics of the deposited nanopads, in order to testify the soldering effects. For this purpose, first, a carbon nanotube field effect transistor (CNTFET) was soldered to see whether the conductivity of the transistor was improved. Next, the thermal performance of the nanopads were observed by heating them in an oven. Last, the nanopads were mechanically pushed by an AFM probe to test the physical connection between the nanopads and the substrate. Experimental results showed that the nanosoldering dramatically reduced the contact resistance of the transistor. Moreover, the nanopads could withstand high temperature and mechanical push. Consequently, field-emission deposition of the AFM promised a bright future in nanosoldering.

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