High-resolution nanowire atomic force microscope probe grownby a field-emission induced process

2004 ◽  
Vol 84 (25) ◽  
pp. 5207-5209 ◽  
Author(s):  
A. B. H. Tay ◽  
J. T. L. Thong
Keyword(s):  
High Resolution ◽  
Atomic Force Microscope ◽  
Field Emission ◽  
Atomic Force Microscope Probe ◽  
Atomic Force ◽  
Microscope Probe

scholarly journals A local field emission study of partially aligned carbon-nanotubes by atomic force microscope probe

Carbon ◽  
2007 ◽  
Vol 45 (15) ◽  
pp. 2957-2971 ◽  
Author(s):  
A. Di Bartolomeo ◽  
A. Scarfato ◽  
F. Giubileo ◽  
F. Bobba ◽  
M. Biasiucci ◽  
...  
Keyword(s):  
Carbon Nanotubes ◽  
Atomic Force Microscope ◽  
Field Emission ◽  
Local Field ◽  
Atomic Force Microscope Probe ◽  
Atomic Force ◽  
Aligned Carbon Nanotubes ◽  
Emission Study ◽  
Microscope Probe

High-resolution atomic force microscope nanotip grown by self-field emission

2002 ◽  
Vol 81 (16) ◽  
pp. 3037-3039 ◽  
Author(s):  
C. H. Oon ◽  
J. T. L. Thong ◽  
Y. Lei ◽  
W. K. Chim
Keyword(s):  
High Resolution ◽  
Atomic Force Microscope ◽  
Field Emission ◽  
Atomic Force

Nanolocalized charge writing in thin SiO2 layers with embedded silicon nanocrystals under an atomic force microscope probe

2007 ◽  
Vol 33 (10) ◽  
pp. 889-892 ◽  
Author(s):  
M. S. Dunaevskii ◽  
A. N. Titkov ◽  
S. Yu. Larkin ◽  
A. B. Speshilova ◽  
S. E. Aleksandrov ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Silicon Nanocrystals ◽  
Atomic Force Microscope Probe ◽  
Atomic Force ◽  
Microscope Probe

5513 Development of 4 point probe with an atomic force microscope probe function

2006 ◽  
Vol 2006.7 (0) ◽  
pp. 311-312
Author(s):  
Masafumi Takahashi ◽  
Kenjiro Ayano ◽  
Gen Hashiguchi ◽  
Takashi Yokokawa ◽  
Hiroyuki Fujita
Keyword(s):  
Atomic Force Microscope ◽  
Atomic Force Microscope Probe ◽  
Atomic Force ◽  
Microscope Probe
Sign in / Sign up

Export Citation Format

Share Document