High-resolution atomic force microscope nanotip grown by self-field emission

2002 ◽  
Vol 81 (16) ◽  
pp. 3037-3039 ◽  
Author(s):  
C. H. Oon ◽  
J. T. L. Thong ◽  
Y. Lei ◽  
W. K. Chim
Keyword(s):  
High Resolution ◽  
Atomic Force Microscope ◽  
Field Emission ◽  
Atomic Force

scholarly journals Set-up of a high-resolution 300 mK atomic force microscope in an ultra-high vacuum compatible 3He/10 T cryostat

2016 ◽  
Vol 87 (7) ◽  
pp. 073702 ◽  
Author(s):  
H. von Allwörden ◽  
K. Ruschmeier ◽  
A. Köhler ◽  
T. Eelbo ◽  
A. Schwarz ◽  
...  
Keyword(s):  
High Resolution ◽  
Atomic Force Microscope ◽  
High Vacuum ◽  
Ultra High Vacuum ◽  
Atomic Force ◽  
Set Up

scholarly journals A local field emission study of partially aligned carbon-nanotubes by atomic force microscope probe

Carbon ◽  
2007 ◽  
Vol 45 (15) ◽  
pp. 2957-2971 ◽  
Author(s):  
A. Di Bartolomeo ◽  
A. Scarfato ◽  
F. Giubileo ◽  
F. Bobba ◽  
M. Biasiucci ◽  
...  
Keyword(s):  
Carbon Nanotubes ◽  
Atomic Force Microscope ◽  
Field Emission ◽  
Local Field ◽  
Atomic Force Microscope Probe ◽  
Atomic Force ◽  
Aligned Carbon Nanotubes ◽  
Emission Study ◽  
Microscope Probe

scholarly journals A Correlative Defect Analyzer Combining Glide Test with Atomic Force Microscope

2013 ◽  
Vol 2013 ◽  
pp. 1-8 ◽  
Author(s):  
Jizhong He
Keyword(s):  
High Resolution ◽  
Atomic Force Microscope ◽  
Optical Imaging ◽  
Hard Disk Drive ◽  
Disk Drive ◽  
Atomic Force ◽  
Typical Data ◽  
Afm Imaging ◽  
Afm Analysis

We have developed a novel instrument combining a glide tester with an Atomic Force Microscope (AFM) for hard disk drive (HDD) media defect test and analysis. The sample stays on the same test spindle during both glide test and AFM imaging without losing the relevant coordinates. This enables an in situ evaluation with the high-resolution AFM of the defects detected by the glide test. The ability for the immediate follow-on AFM analysis solves the problem of relocating the defects quickly and accurately in the current workflow. The tool is furnished with other functions such as scribing, optical imaging, and head burnishing. Typical data generated from the tool are shown at the end of the paper. It is further demonstrated that novel experiments can be carried out on the platform by taking advantage of the correlative capabilities of the tool.

Efficient field emission from α-Fe2O3 nanoflakes on an atomic force microscope tip

2005 ◽  
Vol 87 (2) ◽  
pp. 023103 ◽  
Author(s):  
Y. W. Zhu ◽  
T. Yu ◽  
C. H. Sow ◽  
Y. J. Liu ◽  
A. T. S. Wee ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Field Emission ◽  
Atomic Force

Atomic Force Microscope Deposition Assisted by Electric Field

2013 ◽  
Vol 677 ◽  
pp. 69-73
Author(s):  
Zeng Lei Liu ◽  
Nian Dong Jiao ◽  
Zhi Dong Wang ◽  
Zai Li Dong ◽  
Lian Qing Liu
Keyword(s):  
Electrical Properties ◽  
Electric Field ◽  
Atomic Force Microscope ◽  
Field Emission ◽  
Theoretical Explanation ◽  
Research Field ◽  
Deposition Method ◽  
Practical Applications ◽  
Atomic Force

This paper introduces atomic force microscope (AFM) deposition method to fabricate nanostructures and nanodevices. Field emission theory is introduced in this paper, which provides theoretical explanation for AFM deposition. Dot matrixes are fabricated by AFM deposition on three different substrates, Si, Au and GaAs. Differences of deposition on the three substrates are discussed. AFM deposition has many practical applications. For example, AFM deposition can be used to solder nano components together to improve electrical properties of nanodevices. Besides nanosoldering, AFM deposition can also be used in fabrication of nanodevices. Thus AFM deposition is a valuable research field for future massive applications of nanodevices.

scholarly journals Processing and Analysis of Long-Range Scans with an Atomic Force Microscope (AFM) in Combination with Nanopositioning and Nanomeasuring Technology for Defect Detection and Quality Control

Sensors ◽  
2021 ◽  
Vol 21 (17) ◽  
pp. 5862
Author(s):  
Ingo Ortlepp ◽  
Jaqueline Stauffenberg ◽  
Eberhard Manske
Keyword(s):  
Quality Control ◽  
High Resolution ◽  
Atomic Force Microscope ◽  
Range Of Motion ◽  
Defect Detection ◽  
Large Range ◽  
The Other ◽  
Atomic Force ◽  
Measuring Machine ◽  
The One

This paper deals with a planar nanopositioning and -measuring machine, the so-called nanofabrication machine (NFM-100), in combination with a mounted atomic force microscope (AFM). This planar machine has a circular moving range of 100 mm. Due to the possibility of detecting structures in the nanometre range with an atomic force microscope and the large range of motion of the NFM-100, structures can be analysed with high resolution and precision over large areas by combining the two systems, which was not possible before. On the basis of a grating sample, line scans over lengths in the millimetre range are demonstrated on the one hand; on the other hand, the accuracy as well as various evaluation methods are discussed and analysed.

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