Progress of Scanning Electron Microscopy (SEM) and Electron Probe Microanalysis (EPMA) for Pulp and Paper Specimens. (Part II). Observation at High Magnification by Using Field Emission-SEM (FE-SEM) and Atomic Force Microscope (AFM).
1999 ◽
Vol 5
(6)
◽
pp. 413-419
◽
2017 ◽
Vol 10
(3)
◽
pp. 196
◽
2011 ◽
Vol 20
(04)
◽
pp. 509-523
◽
2007 ◽
Vol 86
(9)
◽
pp. 857-861
◽