Detection of oxygen vacancy defect states in capacitors with ultrathin Ta2O5 films by zero-bias thermally stimulated current spectroscopy
2012 ◽
Vol 27
(6)
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pp. 065021
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1996 ◽
Vol 35
(Part 1, No. 5A)
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pp. 2599-2604
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1995 ◽
2011 ◽
Vol 115
(33)
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pp. 16411-16417
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