Investigation of charging phenomena in silicon nanocrystal metal–oxide–semiconductor capacitors using ramp current–voltage measurements

2003 ◽  
Vol 94 (6) ◽  
pp. 4084-4087 ◽  
Author(s):  
V. Ioannou-Sougleridis ◽  
A. G. Nassiopoulou
Keyword(s):  
Metal Oxide ◽  
Metal Oxide Semiconductor ◽  
Oxide Semiconductor ◽  
Silicon Nanocrystal ◽  
Current Voltage

Characteristic Distributions of Narrow Channel Metal-Oxide-Semiconductor Field-Effect Transistor Memories with Silicon Nanocrystal Floating Gates

1999 ◽  
Vol 38 (Part 1, No. 12B) ◽  
pp. 7230-7232 ◽  
Author(s):  
Eiji Nagata ◽  
Nobuyoshi Takahashi ◽  
Yuri Yasuda ◽  
Takashi Inukai ◽  
Hiroki Ishikuro ◽  
...  
Keyword(s):  
Metal Oxide ◽  
Field Effect ◽  
Field Effect Transistor ◽  
Narrow Channel ◽  
Metal Oxide Semiconductor ◽  
Oxide Semiconductor ◽  
Silicon Nanocrystal ◽  
Floating Gates ◽  
Effect Transistor

Comment on “New Current–Voltage Model for Surrounding-Gate Metal Oxide Semiconductor Field-Effect Transistors”

2006 ◽  
Vol 45 (7) ◽  
pp. 6057-6057 ◽  
Author(s):  
D. Jiménez ◽  
B. Iñíguez ◽  
J. Suñé ◽  
L. F. Marsal ◽  
J. Pallarès ◽  
...  
Keyword(s):  
Metal Oxide ◽  
Field Effect ◽  
Field Effect Transistors ◽  
Metal Oxide Semiconductor ◽  
Oxide Semiconductor ◽  
Current Voltage ◽  
Surrounding Gate
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