Study of Isotope Effect on H−/D− Volume Production in Low-Pressure H2 /D2 Plasmas Using VUV Emission

Author(s):  
O. Fukumasa
2004 ◽  
Vol 44 (56) ◽  
pp. 516-522 ◽  
Author(s):  
O. Fukumasa ◽  
S. Mori ◽  
N. Nakada ◽  
Y. Tauchi ◽  
M. Hamabe ◽  
...  

2011 ◽  
Author(s):  
Tsvetelina V. Paunska ◽  
Antonia P. Shivarova ◽  
Khristo Ts. Tarnev ◽  
Yasuhiko Takeiri ◽  
Katsuyoshi Tsumori

2017 ◽  
Vol 72 (3) ◽  
pp. 175-183 ◽  
Author(s):  
M. Korecki ◽  
E. Wołowiec-Korecka ◽  
M. Sut ◽  
A. Brewka ◽  
W. Stachurski ◽  
...  

Author(s):  
L.H. Bolz ◽  
D.H. Reneker

The attack, on the surface of a polymer, by the atomic, molecular and ionic species that are created in a low pressure electrical discharge in a gas is interesting because: 1) significant interior morphological features may be revealed, 2) dielectric breakdown of polymeric insulation on high voltage power distribution lines involves the attack on the polymer of such species created in a corona discharge, 3) adhesive bonds formed between polymer surfaces subjected to such SDecies are much stronger than bonds between untreated surfaces, 4) the chemical modification of the surface creates a reactive surface to which a thin layer of another polymer may be bonded by glow discharge polymerization.


Author(s):  
Gert Ehrlich

The field ion microscope, devised by Erwin Muller in the 1950's, was the first instrument to depict the structure of surfaces in atomic detail. An FIM image of a (111) plane of tungsten (Fig.l) is typical of what can be done by this microscope: for this small plane, every atom, at a separation of 4.48Å from its neighbors in the plane, is revealed. The image of the plane is highly enlarged, as it is projected on a phosphor screen with a radius of curvature more than a million times that of the sample. Müller achieved the resolution necessary to reveal individual atoms by imaging with ions, accommodated to the object at a low temperature. The ions are created at the sample surface by ionization of an inert image gas (usually helium), present at a low pressure (< 1 mTorr). at fields on the order of 4V/Å.


1998 ◽  
Vol 93 (5) ◽  
pp. 801-807
Author(s):  
JOACHIM SCHULTE ◽  
MICHAEL BOHM ◽  
RAFAEL RAMIREZ

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