Hydrogen redistribution induced by negative-bias-temperature stress in metal–oxide–silicon diodes

2002 ◽  
Vol 81 (13) ◽  
pp. 2397-2399 ◽  
Author(s):  
Ziyuan Liu ◽  
Shinji Fujieda ◽  
Koichi Terashima ◽  
Markus Wilde ◽  
Katsuyuki Fukutani
Keyword(s):  
Metal Oxide ◽  
Temperature Stress ◽  
Negative Bias ◽  
Metal Oxide Silicon ◽  
Bias Temperature Stress

Characteristics of Traps Induced by Hot Holes Under Negative-Bias Temperature Stress in a pMOSFET

2009 ◽  
Vol 30 (11) ◽  
pp. 1194-1196 ◽  
Author(s):  
Minseok Jo ◽  
Man Chang ◽  
Seonghyun Kim ◽  
Seungjae Jung ◽  
Ju-Bong Park ◽  
...  
Keyword(s):  
Temperature Stress ◽  
Negative Bias ◽  
Bias Temperature Stress

Drain Bias Effect on the Interface Traps of pMOSFETs under Negative Bias Temperature Stress

2019 ◽  
Vol 18 (1) ◽  
pp. 219-223
Author(s):  
Junyan Pan ◽  
Jiaqi Yang ◽  
Ying Qiao ◽  
X.Y. Liu ◽  
Ruqi Han ◽  
...  
Keyword(s):  
Temperature Stress ◽  
Negative Bias ◽  
Interface Traps ◽  
Bias Effect ◽  
Drain Bias ◽  
Bias Temperature Stress
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