On the degradation of p-MOSFETs in analog and RF circuits under inhomogeneous negative bias temperature stress

2003 ◽  
Author(s):  
C. Schlunder ◽  
R. Brederlow ◽  
B. Ankele ◽  
A. Lill ◽  
K. Goser ◽  
...  
Keyword(s):  
Temperature Stress ◽  
Rf Circuits ◽  
Negative Bias ◽  
Bias Temperature Stress

Effects of inhomogeneous negative bias temperature stress on p-channel MOSFETs of analog and RF circuits

2005 ◽  
Vol 45 (1) ◽  
pp. 39-46 ◽  
Author(s):  
Christian Schlünder ◽  
Ralf Brederlow ◽  
Benno Ankele ◽  
Wolfgang Gustin ◽  
Karl Goser ◽  
...  
Keyword(s):  
Temperature Stress ◽  
Rf Circuits ◽  
Negative Bias ◽  
Bias Temperature Stress

Characteristics of Traps Induced by Hot Holes Under Negative-Bias Temperature Stress in a pMOSFET

2009 ◽  
Vol 30 (11) ◽  
pp. 1194-1196 ◽  
Author(s):  
Minseok Jo ◽  
Man Chang ◽  
Seonghyun Kim ◽  
Seungjae Jung ◽  
Ju-Bong Park ◽  
...  
Keyword(s):  
Temperature Stress ◽  
Negative Bias ◽  
Bias Temperature Stress

Drain Bias Effect on the Interface Traps of pMOSFETs under Negative Bias Temperature Stress

2019 ◽  
Vol 18 (1) ◽  
pp. 219-223
Author(s):  
Junyan Pan ◽  
Jiaqi Yang ◽  
Ying Qiao ◽  
X.Y. Liu ◽  
Ruqi Han ◽  
...  
Keyword(s):  
Temperature Stress ◽  
Negative Bias ◽  
Interface Traps ◽  
Bias Effect ◽  
Drain Bias ◽  
Bias Temperature Stress

Investigation of the instability of low-temperature poly-silicon thin film transistors under a negative bias temperature stress

2013 ◽  
Vol 9 (S1) ◽  
pp. 13-16 ◽  
Author(s):  
Yu-Mi Kim ◽  
Kwang-Seok Jeong ◽  
Ho-Jin Yun ◽  
Seung-Dong Yang ◽  
Sang-Youl Lee ◽  
...  
Keyword(s):  
Thin Film ◽  
Low Temperature ◽  
Temperature Stress ◽  
Thin Film Transistors ◽  
Negative Bias ◽  
Silicon Thin Film ◽  
Poly Silicon ◽  
Bias Temperature Stress
Sign in / Sign up

Export Citation Format

Share Document