Epitaxial growth of YBCO films on metallic substrates buffered with yttria-stabilized zirconia

Author(s):  
B. Ma
2012 ◽  
Vol 100 (25) ◽  
pp. 252908 ◽  
Author(s):  
Zhongqiang Hu ◽  
Meiya Li ◽  
Yongdan Zhu ◽  
Shizhou Pu ◽  
Xiaolian Liu ◽  
...  

1992 ◽  
Vol 7 (7) ◽  
pp. 1641-1651 ◽  
Author(s):  
D.K. Fork ◽  
S.M. Garrison ◽  
Marilyn Hawley ◽  
T.H. Geballe

Control of the in-plane epitaxial alignment of c-axis YBa2Cu3O7−δ (YBCO) films on yttria-stabilized zirconia (YSZ) substrates is necessary for achieving optimal transport properties. We have used pulsed laser deposition to grow homoepitaxial YSZ and heteroepitaxial CeO2 on YSZ single crystal substrates. This procedure dramatically improves the epitaxy of YBCO and reduces the number of low and high angle grain boundaries. We have also studied the effects of preparing the YSZ growth surface with approximately monolayer amounts of CuO, Y2O3, BaO, and BaZrO3 to determine the effects these compositional variations have on the subsequent YBCO epitaxy. CuO, Y2O3, and BaZrO3 induce an in-plane crystallography of YBCO distinct from that initiated with BaO. Both homoepitaxy and monolayer depositions may be carried out in situ and are simple and effective for controlling the epitaxy and electrical properties of YBCO on YSZ. The effects of substrate temperature, oxygen pressure, and yttria content have also been studied.


CrystEngComm ◽  
2014 ◽  
Vol 16 (21) ◽  
pp. 4369-4372 ◽  
Author(s):  
Yue Zhao ◽  
Wei Wu ◽  
Xiao Tang ◽  
Niels Hessel Andersen ◽  
Zhenghe Han ◽  
...  

A high critical current density of 3 MA cm−2 (77 K, self-field) was achieved on a YBa2Cu3O7 film deposited on Ce0.9La0.1O2 buffered yttria-stabilized zirconia substrate, which is an all-chemical derived configuration.


1998 ◽  
Vol 192 (1-2) ◽  
pp. 175-184 ◽  
Author(s):  
V Trtı́k ◽  
R Aguiar ◽  
F Sánchez ◽  
C Ferrater ◽  
M Varela

2007 ◽  
Vol 21 (18n19) ◽  
pp. 3156-3159
Author(s):  
J. YANG ◽  
H. Z. LIU ◽  
H. ZHANG ◽  
F. QU ◽  
Q. ZHOU ◽  
...  

An Y 2 O 3 film, as seed layer, was directly deposited on the meter long length rolling assisted biaxially textured substrate (RABiTS) NiW tapes by the reactive magnetron sputtering process. Yttria stabilized zirconia (YSZ) and CeO 2 films were further carried out as the barrier and cap layers, and YBCO layer was prepared by magnetron sputtering technique as well. X-ray diffraction was employed to characterize the texture of film. The results showed that on NiW tapes highly textured films were obtained.


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