Epitaxial growth and capacitance-voltage characteristics of BiFeO3/CeO2/yttria-stabilized zirconia/Si(001) heterostructure

2012 ◽  
Vol 100 (25) ◽  
pp. 252908 ◽  
Author(s):  
Zhongqiang Hu ◽  
Meiya Li ◽  
Yongdan Zhu ◽  
Shizhou Pu ◽  
Xiaolian Liu ◽  
...  
CrystEngComm ◽  
2014 ◽  
Vol 16 (21) ◽  
pp. 4369-4372 ◽  
Author(s):  
Yue Zhao ◽  
Wei Wu ◽  
Xiao Tang ◽  
Niels Hessel Andersen ◽  
Zhenghe Han ◽  
...  

A high critical current density of 3 MA cm−2 (77 K, self-field) was achieved on a YBa2Cu3O7 film deposited on Ce0.9La0.1O2 buffered yttria-stabilized zirconia substrate, which is an all-chemical derived configuration.


1998 ◽  
Vol 192 (1-2) ◽  
pp. 175-184 ◽  
Author(s):  
V Trtı́k ◽  
R Aguiar ◽  
F Sánchez ◽  
C Ferrater ◽  
M Varela

2007 ◽  
Vol 21 (18n19) ◽  
pp. 3156-3159
Author(s):  
J. YANG ◽  
H. Z. LIU ◽  
H. ZHANG ◽  
F. QU ◽  
Q. ZHOU ◽  
...  

An Y 2 O 3 film, as seed layer, was directly deposited on the meter long length rolling assisted biaxially textured substrate (RABiTS) NiW tapes by the reactive magnetron sputtering process. Yttria stabilized zirconia (YSZ) and CeO 2 films were further carried out as the barrier and cap layers, and YBCO layer was prepared by magnetron sputtering technique as well. X-ray diffraction was employed to characterize the texture of film. The results showed that on NiW tapes highly textured films were obtained.


2008 ◽  
Vol 34 (4) ◽  
pp. 1047-1050 ◽  
Author(s):  
S. Kaneko ◽  
K. Akiyama ◽  
T. Ito ◽  
Y. Hirabayashi ◽  
S. Ohya ◽  
...  

Sign in / Sign up

Export Citation Format

Share Document