Real-time evolution of trapped charge in a SiO2 layer: An electrostatic force microscopy study

2001 ◽  
Vol 79 (13) ◽  
pp. 2010-2012 ◽  
Author(s):  
G. H. Buh ◽  
H. J. Chung ◽  
Y. Kuk
Keyword(s):  
Real Time ◽  
Time Evolution ◽  
Electrostatic Force ◽  
Microscopy Study ◽  
Sio2 Layer ◽  
Electrostatic Force Microscopy ◽  
Force Microscopy ◽  
Trapped Charge

Fast and non-invasive conductivity determination by the dielectric response of reduced graphene oxide: an electrostatic force microscopy study

Nanoscale ◽  
2012 ◽  
Vol 4 (22) ◽  
pp. 7231 ◽  
Author(s):  
Cristina Gómez-Navarro ◽  
Francisco J. Guzmán-Vázquez ◽  
Julio Gómez-Herrero ◽  
Juan J. Saenz ◽  
G. M. Sacha
Keyword(s):  
Graphene Oxide ◽  
Reduced Graphene Oxide ◽  
Dielectric Response ◽  
Electrostatic Force ◽  
Microscopy Study ◽  
Electrostatic Force Microscopy ◽  
Force Microscopy ◽  
Non Invasive ◽  
Reduced Graphene

DISSIPATION OF CHARGES IN SILICON NANOCRYSTALS EMBEDDED IN SiO2 DIELECTRIC FILMS: AN ELECTROSTATIC FORCE MICROSCOPY STUDY

2005 ◽  
Vol 04 (04) ◽  
pp. 709-715
Author(s):  
C. Y. NG ◽  
H. W. LAU ◽  
T. P. CHEN ◽  
O. K. TAN ◽  
V. S. W. LIM
Keyword(s):  
Silicon Nanocrystals ◽  
Electrostatic Force ◽  
Microscopy Study ◽  
Dielectric Films ◽  
Electrostatic Force Microscopy ◽  
Force Microscopy ◽  
Charge Cloud ◽  
Lower Charge ◽  
Charge Decay ◽  
Charge Change

In this paper, we report a mapping of charge transport in silicon nanocrystals ( nc - Si ) embedded in SiO 2 dielectric films with electrostatic force microscopy (EFM). By using contact EFM mode, positive and negative charges can be deposited on nc - Si . We found that the charge diffusion from the charged nc - Si to the surrounding neighboring uncharged nc - Si is the dominant mechanism during charge decay. A longer decay time was observed for a wider area of stored charge (i.e. 3 charged spots) due to the diffusion of charges being blocked by the surrounding charged nc - Si . This result is consistent with the increase of charge cloud size during the charge decay and the lower charge change percentage for 3 charged spots.

Electrostatic force microscopy study of electrical conductivity of hydrogen-terminated CVD diamond films

2007 ◽  
Vol 204 (9) ◽  
pp. 2915-2919
Author(s):  
A. Volodin ◽  
C. Toma ◽  
G. Bogdan ◽  
W. Deferme ◽  
K. Haenen ◽  
...  
Keyword(s):  
Electrical Conductivity ◽  
Electrostatic Force ◽  
Diamond Films ◽  
Cvd Diamond ◽  
Microscopy Study ◽  
Electrostatic Force Microscopy ◽  
Force Microscopy

Electrostatic force microscopy study about the hole trap in thin nitride/oxide/semiconductor structure

2008 ◽  
Vol 92 (13) ◽  
pp. 132901 ◽  
Author(s):  
Jong-Hun Kim ◽  
Hyunho Noh ◽  
Z. G. Khim ◽  
Kwang Sun Jeon ◽  
Young June Park ◽  
...  
Keyword(s):  
Electrostatic Force ◽  
Microscopy Study ◽  
Semiconductor Structure ◽  
Oxide Semiconductor ◽  
Electrostatic Force Microscopy ◽  
Hole Trap ◽  
Force Microscopy ◽  
Nitride Oxide

scholarly journals Review of time-resolved non-contact electrostatic force microscopy techniques with applications to ionic transport measurements

2019 ◽  
Vol 10 ◽  
pp. 617-633 ◽  
Author(s):  
Aaron Mascaro ◽  
Yoichi Miyahara ◽  
Tyler Enright ◽  
Omur E Dagdeviren ◽  
Peter Grütter
Keyword(s):  
Atomic Force Microscopy ◽  
Electrostatic Force ◽  
Oscillation Period ◽  
Electrostatic Force Microscopy ◽  
Time Varying ◽  
Time Resolved ◽  
Battery Materials ◽  
Force Microscopy ◽  
Atomic Force ◽  
Microscopy Techniques

Recently, there have been a number of variations of electrostatic force microscopy (EFM) that allow for the measurement of time-varying forces arising from phenomena such as ion transport in battery materials or charge separation in photovoltaic systems. These forces reveal information about dynamic processes happening over nanometer length scales due to the nanometer-sized probe tips used in atomic force microscopy. Here, we review in detail several time-resolved EFM techniques based on non-contact atomic force microscopy, elaborating on their specific limitations and challenges. We also introduce a new experimental technique that can resolve time-varying signals well below the oscillation period of the cantilever and compare and contrast it with those previously established.

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