Time evolution studies of the electrostatic surface potential of low-temperature-grown GaAs using electrostatic force microscopy

2005 ◽  
Vol 97 (4) ◽  
pp. 043703 ◽  
Author(s):  
S. W. Howell ◽  
D. B. Janes
Keyword(s):  
Low Temperature ◽  
Time Evolution ◽  
Surface Potential ◽  
Electrostatic Force ◽  
Electrostatic Force Microscopy ◽  
Force Microscopy ◽  
Electrostatic Surface Potential ◽  
Low Temperature Grown Gaas

Surface Potentials of Conjugated Molecules on Metal Surfaces: Measurements Using Electrostatic Force Microscopy and Calculations using a Preliminary Physically-Based Model.

2000 ◽  
Vol 636 ◽  
Author(s):  
S. Howell ◽  
D. Kuila ◽  
A. W. Ghosh ◽  
T. Rakshit ◽  
H. McNally ◽  
...  
Keyword(s):  
Surface Potential ◽  
Electrostatic Force ◽  
Self Assembled Monolayers ◽  
Electrostatic Force Microscopy ◽  
Conjugated Molecules ◽  
Physically Based Model ◽  
Force Microscopy ◽  
Physically Based ◽  
Aromatic Thiols ◽  
Assembled Monolayers

AbstractThe electrostatic surface potential of self-assembled monolayers (SAMs) of aliphatic and aromatic thiols has been measured using electrostatic force microscopy. The variation of the surface potential of chemisorbed alkanethiols, with respect to bare Au(111), is observed to increase with increasing chain length. The trend is similar to that observed in the literature. A preliminary theoretical model, based on treating the monolayer as a sheet of dipoles, has been used to calculate the surface potential of alkanethiols. Similar measurements on several aromatic thiols, with a symmetric and non-symmetric molecular structure, reveal that non-symmetric systems have significantly higher potential (≥ 170mV) than the symmetric molecules.

scholarly journals Probing the dopant profile in nanoscale devices by low temperature electrostatic force microscopy

AIP Advances ◽  
2019 ◽  
Vol 9 (12) ◽  
pp. 125212
Author(s):  
Wanqing Wang ◽  
Zhao Fan ◽  
Kaixiang Chen ◽  
Hao Wei ◽  
Yaping Dan
Keyword(s):  
Low Temperature ◽  
Electrostatic Force ◽  
Electrostatic Force Microscopy ◽  
Nanoscale Devices ◽  
Force Microscopy ◽  
Dopant Profile
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