Electrostatic Force Microscopy Study of Single Au−CdSe Hybrid Nanodumbbells: Evidence for Light-Induced Charge Separation

Nano Letters ◽  
2009 ◽  
Vol 9 (5) ◽  
pp. 2031-2039 ◽  
Author(s):  
Ronny Costi ◽  
Guy Cohen ◽  
Asaf Salant ◽  
Eran Rabani ◽  
Uri Banin
Keyword(s):  
Charge Separation ◽  
Electrostatic Force ◽  
Microscopy Study ◽  
Electrostatic Force Microscopy ◽  
Force Microscopy ◽  
Induced Charge

Rubbing-induced charge domains observed by electrostatic force microscopy: effect on liquid crystal alignment

2003 ◽  
Vol 30 (5) ◽  
pp. 591-598 ◽  
Author(s):  
I. H. Bechtold ◽  
M. P. De Santo ◽  
J. J. Bonvent ◽  
E. A. Oliveira ◽  
R. Barberi ◽  
...  
Keyword(s):  
Liquid Crystal ◽  
Electrostatic Force ◽  
Electrostatic Force Microscopy ◽  
Force Microscopy ◽  
Liquid Crystal Alignment ◽  
Crystal Alignment ◽  
Induced Charge

Fast and non-invasive conductivity determination by the dielectric response of reduced graphene oxide: an electrostatic force microscopy study

Nanoscale ◽  
2012 ◽  
Vol 4 (22) ◽  
pp. 7231 ◽  
Author(s):  
Cristina Gómez-Navarro ◽  
Francisco J. Guzmán-Vázquez ◽  
Julio Gómez-Herrero ◽  
Juan J. Saenz ◽  
G. M. Sacha
Keyword(s):  
Graphene Oxide ◽  
Reduced Graphene Oxide ◽  
Dielectric Response ◽  
Electrostatic Force ◽  
Microscopy Study ◽  
Electrostatic Force Microscopy ◽  
Force Microscopy ◽  
Non Invasive ◽  
Reduced Graphene

scholarly journals Atomic Force Microscope Study of Ag-Conduct Polymer Hybrid Films: Evidence for Light-Induced Charge Separation

Nanomaterials ◽  
2020 ◽  
Vol 10 (9) ◽  
pp. 1819
Author(s):  
Yinghui Wu ◽  
Dong Wang ◽  
Jinyuan Liu ◽  
Houzhi Cai ◽  
Yueqiang Zhang
Keyword(s):  
Charge Separation ◽  
Electrostatic Force ◽  
High Sensitivity ◽  
Kelvin Probe ◽  
Ag Nps ◽  
Kelvin Probe Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Material Systems ◽  
Induced Charge

Scanning Kelvin probe microscopy (SKPM), electrostatic force microscopy (EFM) are used to study the microscopic processes of the photo-induced charge separation at the interface of Ag and conductive polymers, i.e., poly[2,6-(4,4-bis-(2-ethylhexyl)-4H-cyclopenta[2,1-b;3,4-bʹ]dithiophene)-alt-4,7-(2,1,3-benzothiadiazole)] (PCPDTBT) and poly(3-hexylthiophene-2,5-diyl) (P3HT). They are also widely used in order to directly observe the charge distribution and dynamic changes at the interfaces in nanostructures, owing to their high sensitivity. Using SKPM, it is proved that the charge of the photo-induced polymer PCPDTBT is transferred to Ag nanoparticles (NPs). The surface charge of the Ag-induced NPs is quantified while using EFM, and it is determined that the charge is injected into the polymer P3HT from the Ag NPs. We expect that this technology will provide guidance to facilitate the separation and transfer of the interfacial charges in the composite material systems and it will be applicable to various photovoltaic material systems.

Charge separation in CdSe/CdTe hetero-nanowires measured by electrostatic force microscopy

2012 ◽  
Vol 100 (2) ◽  
pp. 022110 ◽  
Author(s):  
Sebastian Schäfer ◽  
Aina Reich ◽  
Zhe Wang ◽  
Tobias Kipp ◽  
Alf Mews
Keyword(s):  
Charge Separation ◽  
Electrostatic Force ◽  
Electrostatic Force Microscopy ◽  
Force Microscopy

DISSIPATION OF CHARGES IN SILICON NANOCRYSTALS EMBEDDED IN SiO2 DIELECTRIC FILMS: AN ELECTROSTATIC FORCE MICROSCOPY STUDY

2005 ◽  
Vol 04 (04) ◽  
pp. 709-715
Author(s):  
C. Y. NG ◽  
H. W. LAU ◽  
T. P. CHEN ◽  
O. K. TAN ◽  
V. S. W. LIM
Keyword(s):  
Silicon Nanocrystals ◽  
Electrostatic Force ◽  
Microscopy Study ◽  
Dielectric Films ◽  
Electrostatic Force Microscopy ◽  
Force Microscopy ◽  
Charge Cloud ◽  
Lower Charge ◽  
Charge Decay ◽  
Charge Change

In this paper, we report a mapping of charge transport in silicon nanocrystals ( nc - Si ) embedded in SiO 2 dielectric films with electrostatic force microscopy (EFM). By using contact EFM mode, positive and negative charges can be deposited on nc - Si . We found that the charge diffusion from the charged nc - Si to the surrounding neighboring uncharged nc - Si is the dominant mechanism during charge decay. A longer decay time was observed for a wider area of stored charge (i.e. 3 charged spots) due to the diffusion of charges being blocked by the surrounding charged nc - Si . This result is consistent with the increase of charge cloud size during the charge decay and the lower charge change percentage for 3 charged spots.

Electrostatic force microscopy study of electrical conductivity of hydrogen-terminated CVD diamond films

2007 ◽  
Vol 204 (9) ◽  
pp. 2915-2919
Author(s):  
A. Volodin ◽  
C. Toma ◽  
G. Bogdan ◽  
W. Deferme ◽  
K. Haenen ◽  
...  
Keyword(s):  
Electrical Conductivity ◽  
Electrostatic Force ◽  
Diamond Films ◽  
Cvd Diamond ◽  
Microscopy Study ◽  
Electrostatic Force Microscopy ◽  
Force Microscopy

Electrostatic force microscopy study about the hole trap in thin nitride/oxide/semiconductor structure

2008 ◽  
Vol 92 (13) ◽  
pp. 132901 ◽  
Author(s):  
Jong-Hun Kim ◽  
Hyunho Noh ◽  
Z. G. Khim ◽  
Kwang Sun Jeon ◽  
Young June Park ◽  
...  
Keyword(s):  
Electrostatic Force ◽  
Microscopy Study ◽  
Semiconductor Structure ◽  
Oxide Semiconductor ◽  
Electrostatic Force Microscopy ◽  
Hole Trap ◽  
Force Microscopy ◽  
Nitride Oxide
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