Resonance frequency and Q factor mapping by ultrasonic atomic force microscopy

2001 ◽  
Vol 78 (13) ◽  
pp. 1939-1941 ◽  
Author(s):  
Kazushi Yamanaka ◽  
Yoshiki Maruyama ◽  
Toshihiro Tsuji ◽  
Keiichi Nakamoto
Keyword(s):  
Atomic Force Microscopy ◽  
Resonance Frequency ◽  
Q Factor ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals An ultrafast piezoelectric Z-scanner with a resonance frequency above 1.1 MHz for high-speed atomic force microscopy

2022 ◽  
Vol 93 (1) ◽  
pp. 013701
Author(s):  
Masahiro Shimizu ◽  
Chihiro Okamoto ◽  
Kenichi Umeda ◽  
Shinji Watanabe ◽  
Toshio Ando ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Resonance Frequency ◽  
High Speed ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Frequency, amplitude, and phase measurements in contact resonance atomic force microscopies

2014 ◽  
Vol 5 ◽  
pp. 278-288 ◽  
Author(s):  
Gheorghe Stan ◽  
Santiago D Solares
Keyword(s):  
Atomic Force Microscopy ◽  
Resonance Frequency ◽  
Phase Locked Loop ◽  
Phase Response ◽  
Phase Measurements ◽  
Force Microscopy ◽  
Atomic Force ◽  
Loop Detection ◽  
Similarities And Differences ◽  
Contact Resonance

The resonance frequency, amplitude, and phase response of the first two eigenmodes of two contact-resonance atomic force microscopy (CR-AFM) configurations, which differ in the method used to excite the system (cantilever base vs sample excitation), are analyzed in this work. Similarities and differences in the observables of the cantilever dynamics, as well as the different effect of the tip–sample contact properties on those observables in each configuration are discussed. Finally, the expected accuracy of CR-AFM using phase-locked loop detection is investigated and quantification of the typical errors incurred during measurements is provided.

scholarly journals Resonance frequency-retuned quartz tuning fork as a force sensor for noncontact atomic force microscopy

2014 ◽  
Vol 105 (4) ◽  
pp. 043107 ◽  
Author(s):  
Hiroaki Ooe ◽  
Tatsuya Sakuishi ◽  
Makoto Nogami ◽  
Masahiko Tomitori ◽  
Toyoko Arai
Keyword(s):  
Atomic Force Microscopy ◽  
Resonance Frequency ◽  
Tuning Fork ◽  
Quartz Tuning Fork ◽  
Force Sensor ◽  
Force Microscopy ◽  
Atomic Force

Measurements of Resonance Frequency of Parylene Microspring Arrays Using Atomic Force Microscopy

2011 ◽  
Vol 1299 ◽  
Author(s):  
C. Gaire ◽  
M. He ◽  
A. Zandiatashbar ◽  
P.-I. Wang ◽  
R. C. Picu ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Forced Oscillation ◽  
Mechanical Vibration ◽  
Vertical Displacement ◽  
Q Factor ◽  
Vibration System ◽  
Flat Plates ◽  
Parylene C ◽  
Force Microscopy ◽  
Atomic Force

ABSTRACTA mechanical vibration system was made by sandwiching an array of parylene-C microsprings between two flat plates of Si. This system was driven mechanically in forced oscillation using a piezo transducer attached to the bottom Si plate. An atomic force microscope was used to record the displacement of the top plate in both the contact and non-contact modes. At the resonance, the system was observed to give large vertical displacement amplitude of up to 100 nm with a Q-factor of up to 900.

Mapping substrate/film adhesion with contact-resonance-frequency atomic force microscopy

2006 ◽  
Vol 89 (2) ◽  
pp. 021911 ◽  
Author(s):  
D. C. Hurley ◽  
M. Kopycinska-Müller ◽  
E. D. Langlois ◽  
A. B. Kos ◽  
N. Barbosa
Keyword(s):  
Atomic Force Microscopy ◽  
Resonance Frequency ◽  
Force Microscopy ◽  
Atomic Force ◽  
Film Adhesion ◽  
Substrate Film ◽  
Contact Resonance

Multi-Mode Q Control in Multifrequency Atomic Force Microscopy

2015 ◽  
Author(s):  
Michael G. Ruppert ◽  
S. O. Reza Moheimani
Keyword(s):  
Atomic Force Microscopy ◽  
Flexible Structures ◽  
Pole Placement ◽  
Full Potential ◽  
Q Factor ◽  
Control Approach ◽  
Force Microscopy ◽  
Bimodal Imaging ◽  
Atomic Force ◽  
Multi Mode

Various Atomic Force Microscopy (AFM) modes have emerged which rely on the excitation and detection of multiple eigenmodes of the microcantilever. The conventional control loops employed in multifrequency AFM (MF-AFM) such as bimodal imaging where the fundamental mode is used to map the topography and a higher eigenmode is used to map sample material properties only focus on maintaining low bandwidth signals such as amplitude and/or frequency shift. However, the ability to perform additional high bandwidth control of the quality (Q) factor of the participating modes is believed to be imperative to unfolding the full potential of these methods. This can be achieved by employing a multi-mode Q control approach utilizing positive position feedback. The controller exhibits remarkable performance in arbitrarily modifying the Q factor of multiple eigenmodes as well as guaranteed stability properties when used on flexible structures with collocated actuators and sensors. A controller design method based on pole placement optimization is proposed for setting an arbitrary on-resonance Q factor of the participating eigenmodes. Experimental results using bimodal AFM imaging on a two component polymer sample are presented.

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