Measurements of Resonance Frequency of Parylene Microspring Arrays Using Atomic Force Microscopy

2011 ◽  
Vol 1299 ◽  
Author(s):  
C. Gaire ◽  
M. He ◽  
A. Zandiatashbar ◽  
P.-I. Wang ◽  
R. C. Picu ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Forced Oscillation ◽  
Mechanical Vibration ◽  
Vertical Displacement ◽  
Q Factor ◽  
Vibration System ◽  
Flat Plates ◽  
Parylene C ◽  
Force Microscopy ◽  
Atomic Force

ABSTRACTA mechanical vibration system was made by sandwiching an array of parylene-C microsprings between two flat plates of Si. This system was driven mechanically in forced oscillation using a piezo transducer attached to the bottom Si plate. An atomic force microscope was used to record the displacement of the top plate in both the contact and non-contact modes. At the resonance, the system was observed to give large vertical displacement amplitude of up to 100 nm with a Q-factor of up to 900.

scholarly journals Scanning Electrochemical Microscopy-Atomic Force Microscopy Probes from Pyrolyzed Parylene C

2013 ◽  
Vol 19 (S2) ◽  
pp. 46-47
Author(s):  
K.C. Morton ◽  
M.A. Derylo ◽  
A.E. Weber ◽  
L.A. Baker
Keyword(s):  
Atomic Force Microscopy ◽  
Scanning Electrochemical Microscopy ◽  
Parylene C ◽  
Force Microscopy ◽  
Atomic Force ◽  
Electrochemical Microscopy

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

scholarly journals Mechanical Vibration Measurement of Solidly Mounted Resonator in Fluid by Atomic Force Microscopy

Micromachines ◽  
2017 ◽  
Vol 8 (8) ◽  
pp. 244
Author(s):  
Fei Xu ◽  
Xinyi Guo ◽  
Linyan Xu ◽  
Xuexin Duan ◽  
Hao Zhang ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Mechanical Vibration ◽  
Vibration Measurement ◽  
Force Microscopy ◽  
Atomic Force

Atomic force microscopy analysis of morphology of thin pentacene films deposited on parylene-C and benzocyclobutene

2013 ◽  
Vol 607 ◽  
pp. 170-173 ◽  
Author(s):  
Maksym Iazykov ◽  
Mohsen Erouel ◽  
Jacques Tardy ◽  
Valeriy A. Skryshevsky ◽  
Magali Phaner-Goutorbe
Keyword(s):  
Atomic Force Microscopy ◽  
Atomic Force Microscopy Analysis ◽  
Parylene C ◽  
Force Microscopy ◽  
Atomic Force ◽  
Microscopy Analysis

A combined X-ray, ellipsometry and atomic force microscopy study on thin parylene-C films

2009 ◽  
Vol 206 (8) ◽  
pp. 1727-1730 ◽  
Author(s):  
Heinz-Georg Flesch ◽  
Oliver Werzer ◽  
Martin Weis ◽  
Ján Jakabovič ◽  
Jaroslav Kováč ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Microscopy Study ◽  
Atomic Force Microscopy Study ◽  
Parylene C ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Dual-pulse photoactivated atomic force microscopy

2021 ◽  
Vol 11 (1) ◽  
Author(s):  
Byullee Park ◽  
Seunghyun Lee ◽  
Jimin Kwon ◽  
Woojo Kim ◽  
Sungjune Jung ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Small Molecule ◽  
Laser Power ◽  
Signal To Noise Ratio ◽  
Mechanical Vibration ◽  
Thermal Relaxation ◽  
Laser Pulses ◽  
Semiconductor Films ◽  
Force Microscopy ◽  
Atomic Force

AbstractPhotoactivated atomic force microscopy (pAFM), which integrates light excitation and mechanical detection of the deflections of a cantilever tip, has become a widely used tool for probing nanoscale structures. Raising the illuminating laser power is an obvious way to boost the signal-to-noise ratio of pAFM, but strong laser power can damage both the sample and cantilever tip. Here, we demonstrate a dual-pulse pAFM (DP-pAFM) that avoids this problem by using two laser pulses with a time delay. The first laser heats the light absorber and alters the local Grüneisen parameter value, and the second laser boosts the mechanical vibration within the thermal relaxation time. Using this technique, we successfully mapped the optical structures of small-molecule semiconductor films. Of particular interest, DP-pAFM clearly visualized nanoscale cracks in organic semiconductor films, which create crucial problems for small-molecule semiconductors. DP-pAFM opens a promising new optical avenue for studying complex nanoscale phenomena in various research fields.

Imaging of Dynamic Viscoelastic Properties of a Phase-Separated Polymer Surface by Forced Oscillation Atomic Force Microscopy

1994 ◽  
Vol 27 (26) ◽  
pp. 7932-7934 ◽  
Author(s):  
Tisato Kajiyama ◽  
Keiji Tanaka ◽  
Isao Ohki ◽  
Shou-Ren Ge ◽  
Jeong-Sik Yoon ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Viscoelastic Properties ◽  
Forced Oscillation ◽  
Polymer Surface ◽  
Force Microscopy ◽  
Atomic Force

Resonance frequency and Q factor mapping by ultrasonic atomic force microscopy

2001 ◽  
Vol 78 (13) ◽  
pp. 1939-1941 ◽  
Author(s):  
Kazushi Yamanaka ◽  
Yoshiki Maruyama ◽  
Toshihiro Tsuji ◽  
Keiichi Nakamoto
Keyword(s):  
Atomic Force Microscopy ◽  
Resonance Frequency ◽  
Q Factor ◽  
Force Microscopy ◽  
Atomic Force

Multi-Mode Q Control in Multifrequency Atomic Force Microscopy

2015 ◽  
Author(s):  
Michael G. Ruppert ◽  
S. O. Reza Moheimani
Keyword(s):  
Atomic Force Microscopy ◽  
Flexible Structures ◽  
Pole Placement ◽  
Full Potential ◽  
Q Factor ◽  
Control Approach ◽  
Force Microscopy ◽  
Bimodal Imaging ◽  
Atomic Force ◽  
Multi Mode

Various Atomic Force Microscopy (AFM) modes have emerged which rely on the excitation and detection of multiple eigenmodes of the microcantilever. The conventional control loops employed in multifrequency AFM (MF-AFM) such as bimodal imaging where the fundamental mode is used to map the topography and a higher eigenmode is used to map sample material properties only focus on maintaining low bandwidth signals such as amplitude and/or frequency shift. However, the ability to perform additional high bandwidth control of the quality (Q) factor of the participating modes is believed to be imperative to unfolding the full potential of these methods. This can be achieved by employing a multi-mode Q control approach utilizing positive position feedback. The controller exhibits remarkable performance in arbitrarily modifying the Q factor of multiple eigenmodes as well as guaranteed stability properties when used on flexible structures with collocated actuators and sensors. A controller design method based on pole placement optimization is proposed for setting an arbitrary on-resonance Q factor of the participating eigenmodes. Experimental results using bimodal AFM imaging on a two component polymer sample are presented.

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