Resonance frequency analysis for surface-coupled atomic force microscopy cantilever in ambient and liquid environments

2008 ◽  
Vol 92 (8) ◽  
pp. 083102 ◽  
Author(s):  
Boris Mirman ◽  
Sergei V. Kalinin
Keyword(s):  
Atomic Force Microscopy ◽  
Resonance Frequency ◽  
Frequency Analysis ◽  
Resonance Frequency Analysis ◽  
Force Microscopy ◽  
Atomic Force ◽  
Atomic Force Microscopy Cantilever

scholarly journals An ultrafast piezoelectric Z-scanner with a resonance frequency above 1.1 MHz for high-speed atomic force microscopy

2022 ◽  
Vol 93 (1) ◽  
pp. 013701
Author(s):  
Masahiro Shimizu ◽  
Chihiro Okamoto ◽  
Kenichi Umeda ◽  
Shinji Watanabe ◽  
Toshio Ando ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Resonance Frequency ◽  
High Speed ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Detection of atomic force microscopy cantilever displacement with a transmitted electron beam

2016 ◽  
Vol 109 (4) ◽  
pp. 043111 ◽  
Author(s):  
R. Wagner ◽  
T. J. Woehl ◽  
R. R. Keller ◽  
J. P. Killgore
Keyword(s):  
Atomic Force Microscopy ◽  
Electron Beam ◽  
Force Microscopy ◽  
Atomic Force ◽  
Atomic Force Microscopy Cantilever

scholarly journals Frequency, amplitude, and phase measurements in contact resonance atomic force microscopies

2014 ◽  
Vol 5 ◽  
pp. 278-288 ◽  
Author(s):  
Gheorghe Stan ◽  
Santiago D Solares
Keyword(s):  
Atomic Force Microscopy ◽  
Resonance Frequency ◽  
Phase Locked Loop ◽  
Phase Response ◽  
Phase Measurements ◽  
Force Microscopy ◽  
Atomic Force ◽  
Loop Detection ◽  
Similarities And Differences ◽  
Contact Resonance

The resonance frequency, amplitude, and phase response of the first two eigenmodes of two contact-resonance atomic force microscopy (CR-AFM) configurations, which differ in the method used to excite the system (cantilever base vs sample excitation), are analyzed in this work. Similarities and differences in the observables of the cantilever dynamics, as well as the different effect of the tip–sample contact properties on those observables in each configuration are discussed. Finally, the expected accuracy of CR-AFM using phase-locked loop detection is investigated and quantification of the typical errors incurred during measurements is provided.

Time-frequency analysis of the tip motion in liquids using the wavelet transform in dynamic atomic force microscopy

2018 ◽  
Vol 29 (38) ◽  
pp. 385702 ◽  
Author(s):  
Zhenyu Wang ◽  
Jianqiang Qian ◽  
Yingzi Li ◽  
Yingxu Zhang ◽  
Guanqiao Shan ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Wavelet Transform ◽  
Frequency Analysis ◽  
Time Frequency Analysis ◽  
Force Microscopy ◽  
Time Frequency ◽  
Atomic Force

scholarly journals Resonance frequency-retuned quartz tuning fork as a force sensor for noncontact atomic force microscopy

2014 ◽  
Vol 105 (4) ◽  
pp. 043107 ◽  
Author(s):  
Hiroaki Ooe ◽  
Tatsuya Sakuishi ◽  
Makoto Nogami ◽  
Masahiko Tomitori ◽  
Toyoko Arai
Keyword(s):  
Atomic Force Microscopy ◽  
Resonance Frequency ◽  
Tuning Fork ◽  
Quartz Tuning Fork ◽  
Force Sensor ◽  
Force Microscopy ◽  
Atomic Force
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